Multiple sample sources for use with mass spectrometers, and apparatus, devices, and methods therefor
View Patent ↗A method for introducing samples through a boundary member partially defining a chamber at an entrance point coaxial to a sampling inlet of a mass spectrometer is described. Field-free conditions can be established in at least one region of the chamber. The sample can be introduced adjacent to the sampling inlet, and introducing at least a second sample can be introduced through at least one other entrance point in the chamber not adjacent to the sampling inlet. An apparatus having a sampling inlet and a boundary member partially defining a chamber is also described. Field-free conditions can be established in at least one region of the chamber, and there can be a first aperture in the boundary member through which a source emits sample. Related devices, uses and mass spectrometers are also described.
1. A method for introducing samples to a mass spectrometer from at least two sources, the method comprising:
introducing a first of the samples through a first entrance point in a chamber in communication with a sampling inlet to the mass spectrometer, the first entrance point being defined in a boundary member that at least partially defines the chamber, the first entrance point being coaxial to the sampling inlet, the chamber having at least one region where field-free conditions are established, the first of the samples being introduced substantially adjacent to the sampling inlet; and introducing at least a second of the samples through at least one other entrance point defined in the chamber at a non-adjacent position to the sampling inlet; the chamber further defines a gas entrance for introducing a gas into the chamber, wherein a gas flow stream is established in which the gas flow stream flows partially toward the first entrance point and partially toward the sampling inlet, whereby at least the second of the samples is directed to the sampling inlet by the gas flow stream.
2. The method according to claim 1 , wherein the introducing the first of the samples is associated with an electromagnetic field and the introducing the at least one other entrance point is sufficiently remote from the first entrance point such that the introduction of at least the second of the samples does not have a detrimental effect on the analysis of the first of the samples by the mass spectrometer.
3. The method according to claim 1 , wherein the first entrance point is located at a distance of at least 3 millimeters from the at least one other entrance point.
4. The method according to claim 1 , wherein at least one of the samples comprises ions or charged droplets.
5. The method according to claim 4 , wherein at least the second of the samples comprises ions or charged droplets of opposite polarity to the first of the samples.
6. The method according to claim 5 , wherein ions of the first of the samples and ions of the second of the samples are mixed together to conduct ion-ion reactions.
7. The method according to claim 5 , wherein the first of the samples and the second of the samples are mixed together to generate ions from the second of the samples having the same polarity as of the first of the samples.
8. The method according to claim 4 , wherein at least the second of the samples comprises neutral molecules.
9. The method according to claim 8 , wherein the neutral molecules become charged before they are analyzed by the mass spectrometer.
10. The method according to claim 8 , wherein ions of the first of the samples and neutrals of the second of the samples are mixed together to conduct ion-neutral reactions.
11. The method according to claim 4 , wherein ions of the first of the samples and ions of the second of the samples are gated to conduct external calibration.
12. The method according to claim 4 , wherein the first of the samples and the second of the samples are mixed together to conduct internal calibration.
13. The method according to claim 1 , further comprising providing at least one heat source.
14. The method according to claim 1 , wherein the sampling inlet is heated.
15. The method according to claim 1 , wherein at least the second of the samples comprises calibrant molecules.
16. The method according to claim 1 , further comprising gating the introducing the first of the samples and the second of the samples into the sampling inlet.
17. The method according to claim 16 , further comprising gating the at least the second of the samples by alternating the potential applied to the first of the samples.
18. The method according to claim 16 , wherein the gating comprises varying a potential applied to the boundary member.
19. The method according to claim 1 , wherein the first of the samples is introduced through the first entrance point as a spray of charged droplets of a first polarity and the second of the samples is introduced through the at least one other entrance point as one of a spray of droplets of an opposite polarity to the charged droplets of the first of the samples, and a spray of droplets of neutral polarity and the droplets from the second of the samples are mixed with the droplets from the first of the samples.
20. The method according to claim 1 , further comprising providing a channel member attached to the at least one other entrance point.
21. The method according to claim 20 , further comprising providing a passage member attached to the inside of the boundary member, the passage member positioned adjacent to the at least one other entrance point for providing field-free conditions to at least one region of the chamber.
22. The method according to claim 1 , further comprising providing a passage member attached to the inside of the boundary member, the passage member positioned adjacent to the at least one other entrance point for providing field-free conditions to at least one region of the chamber.
23. An interface apparatus for introducing at least one sample into a mass spectrometer, the interface apparatus comprising,
a sampling inlet to the mass spectrometer;
a boundary member at least partially defining a chamber in communication with the sampling inlet, the chamber having at least one region where field-free conditions are established;
a first aperture defined in the boundary member through which a first source can emit a sample, the first aperture being coaxial to the sampling inlet and the sample being directed toward the sampling inlet for passage therethrough;
and at least one other aperture defined in the chamber through which at least one other source can introduce at least one of the sample or another sample into the chamber; and further a gas entrance for introducing a gas into the chamber, wherein a gas flow stream is established in which the gas flow stream flows partially toward the first aperture defined in the boundary member and partially toward the sampling inlet, whereby at least one of the sample or another sample from the at least one other aperture defined in the chamber is directed to the sampling inlet by the gas flow stream.