Ion optics systems
View Patent ↗In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at a position that is substantially independent of the kinetic energy the ion had on entering the ion optics system. In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair.
1. A mass analyzer system comprising:
an ion optics system, the ion optics system comprising:
even number of pairs of ion mirrors arranged such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at a position that is substantially independent of ion kinetic energy wherein the ion mirrors are arranged in pairs where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair and,
a mass analyzer system, the mass analyzer system positioned to receive at least a portion of ions exiting the ion optics system.
2. The mass analyzer system of claim 1 , further comprising:
an ion source capable of providing a pulse of ions, the ion optics system positioned to receive at least a portion of a pulse of ions provided by the ion source; and
an ion detector, the ion detector positioned to receive at least a portion of a pulse of ions exiting the mass analyzer.
3. The mass analyzer system of claim 1 , wherein the mass analyzer comprises one or more of a quadrupole, RF multipole, ion trap, time-of-flight (TOF), and combinations thereof.
4. The mass analyzer system of claim 1 , comprising one or more of an ion selector and an ion fragmentor positioned between the ion optics system and the mass analyzer.
5. The mass analyzer system of claim 1 , further comprising one or more of an ion source, ion selector, ion fragmentor, an ion detector, ion guide, ion-focusing element, ion-steering element, and combinations thereof.
6. A mass analyzer system comprising:
an ion optics system, the ion optics system comprising:
two or more pairs of ion mirrors, each pair of ion mirrors comprising a first member and a second member;
the members of each pair of ion mirrors disposed on opposite sides of a first plane such that the first member of a pair of ion mirrors has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair,
and,
a mass analyzer system, the mass analyzer system positioned to receive at least a portion of ions exiting the ion optics system.
7. The mass analyzer system of claim 6 , wherein the two or more pairs of ion mirrors arranged such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to a focal surface at a position that is substantially independent of the ion kinetic energy.
8. The mass analyzer system of claim 6 , further comprising:
an ion source capable of providing a pulse of ions, the ion optics system positioned to receive at least a portion of a pulse of ions provided by the ion source; and
an ion detector, the ion detector positioned to receive at least a portion of a pulse of ions exiting the mass analyzer.
9. The mass analyzer system of claim 6 , wherein the mass analyzer comprises one or more of a quadrupole, RF multipole, ion trap, time-of-flight (TOF), and combinations thereof.
10. The mass analyzer system of claim 6 , comprising one or more of an ion selector and an ion fragmentor positioned between the ion optics system and the mass analyzer.
11. The mass analyzer system of claim 6 , further comprising one or more of an ion source, ion selector, ion fragmentor, an ion detector, ion guide, ion-focusing element, ion-steering element, and combinations thereof.
12. The mass analyzer system of claim 6 , wherein outgoing trajectories of the ion optics system are displaced by an amount determined by the displacement of a second pair of ion mirrors relative to a first pair of ion mirrors.