Imaging system and pixel defect correction device
View Patent ↗Disclosed herein is an imaging system including: an imaging device; light blocking means for blocking a light receiving section of the imaging device from light; a pixel defect correction section configured to detect and correct defective pixels of the imaging device; a signal processing section configured to process a pixel signal corrected by the pixel defect correction section; and control means for controlling the signal processing section and the light blocking means according to information obtained by the pixel defect correction section; wherein the pixel defect correction section has timing means and measures an operating time with the timing means to estimate a secondary defect count.
1. An imaging system comprising:
an imaging device;
light blocking means for blocking a light receiving section of the imaging device from light;
a pixel defect correction section configured to detect and correct defective pixels of the imaging device;
a signal processing section configured to process a pixel signal corrected by the pixel defect correction section; and
control means for controlling the signal processing section and the light blocking means according to information obtained by the pixel defect correction section;
wherein the pixel defect correction section has timing means and measures an operating time with the timing means to estimate a secondary defect count.
2. The imaging system of claim 1 , wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device so as to restrict a correction count during defect correction in a normal imaging condition.
3. The imaging system of claim 1 , wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device, and
if a defect candidate count is excessively large, the pixel defect correction section blocks light or moves an imaging region to identify overcorrected pixels so as to restrict a dynamic defect correction count in a normal imaging condition.
4. The imaging system of claim 1 comprising information issuance means, wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device, and
the information issuance means issue information to prompt the readjustment of defect detection and correction with light completely blocked or light of a given luminance admitted.
5. The imaging system of claim 4 , wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device, and
if a defect candidate count is excessively large, the information issuance means determine that a system failure has occurred and issue information.
6. The imaging system of claim 1 , wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device, and
the light blocking means automatically block the light receiving section from light to perform static defect detection and correction for self-recovery.
7. The imaging system of claim 1 comprising motion detection means, wherein
the pixel defect correction section estimates a secondary defect count for an operating time based on a defect rate of the imaging device,
if a defect candidate count is excessively large, the motion detection means detect an image motion, and
the light blocking means automatically block the light receiving section from light during an interval free from moving objects to readjust static defect detection and correction.