Method and apparatus for examining surfaces containing effect pigments
View Patent ↗The present invention describes a method for an apparatus for examining surface properties. Properties of effect pigments are to be examined in particular. A surface ( 9 ) to be examined is examined at different emission and reception angles and any curvature of the effect pigments is deduced on the basis of these different angles.
1. A method for examining surface properties, comprising the following steps:
emitting radiation at a first predefined emission angle onto a surface to be examined;
receiving at a first reception angle at least part of the radiation emitted at the first emission angle and thrown back from the surface to be examined, and outputting a plurality of first measured values which are characteristic of the received radiation;
emitting radiation at a second predefined emission angle onto a surface to be examined;
receiving at a second reception angle at least part of the radiation emitted at the second emission angle and thrown back from the surface to be examined, and outputting a plurality of second measured values which are characteristic of the received radiation, wherein at least the emission angles or the reception angles are different; and
determining the angular lifetime of an effect pigment by carrying out a comparison between the first measured values and the second measured values.
2. The method according to claim 1 , wherein the radiation is emitted at a plurality of emission angles.
3. The method according to claim 1 , wherein the light thrown back from the surface is received at a plurality of reception angles.
4. The method according to claim 1 , wherein the radiation is received in a spatially resolved manner.
5. The method according to claim 1 , the difference between the different emission angles or reception angles is less than 5°.
6. The method according to claim 5 , wherein the difference between the different emission angles of reception angles is less than 3°.
7. The method according to claim 5 , wherein the difference between the different emission angles or reception angles is less than 1°.
8. The method according to claim 5 , wherein the difference between the different emission angles or reception angles is less than 0.5°.
9. The method according to claim 1 , wherein at least one movable radiation detector device is used to receive the radiation thrown back from the surface.
10. The method according to claim 1 , wherein at least one movable radiation device is used to emit the radiation onto the surface.
11. An apparatus for examining surface properties, comprising a first radiation device which emits radiation at a first predefined emission angle onto a surface to be examined, a first radiation detector device which receives at a first reception angle at least part of the radiation emitted onto the surface and thrown back from the latter and outputs a plurality of first measured values which are characteristic of the radiation emitted at the first emission angle and received at the first reception angle, wherein a measurement a device is provided which allows an emission of the radiation at a second emission angle and the reception at a second reception angle of the radiation thrown back, and wherein the measurement device allows the outputting of a plurality of second measured values which are characteristic of the radiation emitted at the second emission angle and received at the second reception angle, wherein at least the two emission angles or the two reception angles are different, and a comparison device for determining the angular lifetime of an effect pigment by allowing a comparison of the first measured values with the second measured values.
12. The apparatus according to claim 11 , wherein the measurement device comprises a second radiation device which emits radiation at the predefined second emission angle onto the surface to be examined.
13. The apparatus according to claim 12 , wherein the measurement device comprises a second radiation detector device which receives at the predefined second reception angle the radiation thrown back from the surface.
14. The apparatus according to claim 11 , wherein the measurement device comprises a second radiation detector device which receives at the predefined second reception angle the radiation thrown back from the surface.
15. The apparatus according to claim 11 , wherein the measurement device comprises an emission angle change device which moves the first radiation device relative to the surface and in this way changes the emission angle.
16. The apparatus according to claim 11 , wherein the measurement device comprises a reception angle change device which moves the first radiation detector device relative to the surface and in this way changes the reception angle.
17. The apparatus according to claim 11 , wherein the first emission angle and the second emission angle differ from one another by less than 5°.
18. The apparatus according to claim 17 , wherein the first emission angle and the second emission angle differ from one another by less than 3°.
19. The apparatus according to claim 17 , wherein the first reception angle and the second reception angle differ from one another by less than 2°.
20. The apparatus according to claim 11 , wherein the first reception angle and the second reception angle differ from one another by less than 5°.
21. The apparatus according to claim 20 , wherein the first reception angle and the second reception angle differ from one another by less than 3°.
22. The apparatus according to claim 20 , wherein the first reception angle and the second reception angle differ from one another by less than 1°.
23. The apparatus according to claim 11 , wherein the measurement device comprises a displaceable diaphragm device.