IP Library Granted Patent US 7,554,664
Granted Patent B2
US 7,554,664 · App. 11/878,998 · Granted Jun 30, 2009

Laser scanning microscope

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Quick Facts
Patent No.
US 7,554,664
App. No.
11/878,998
Granted
Jun 30, 2009
Kind
B2
Abstract

Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.

Claims (26)

1. A laser scanning microscope for viewing a sample, the laser scanning microscope comprising:

an optical axis;

means for producing illumination rays along the optical axis for illuminating the sample;

a first detection beam path for passing light from the sample;

a second detection beam path for passing light from the sample;

first filter means for selecting first detection-wavelengths from the first beam path, wherein at least one graduated filter spatially variable in regard to the threshold wavelength between transmission and reflection is provided in the first detection beam path for the selection of the first detection-wavelengths; and

second filter means for selecting second detection-wavelengths from the second beam path, wherein at least one graduated filter spatially variable in regard to the threshold wavelength between transmission and reflection is provided in the second detection beam path for the selection of the second detection-wavelengths.

2. The Laser Scanning Microscope according to claim 1 , further comprising means for disposing the graduated filter is a displaceable manner in the first detection beam path so as to enable variation of the optically effective threshold wavelength of the graduated filter in the first detection beam path.

3. The Laser Scanning Microscope according to claim 2 , further comprising a central actuation unit for controlling the displacement of at least one of the graduated filters.

4. The Laser Scanning Microscope of according to claim 3 , wherein the displacement of at least one of the graduated filters is controlled by a motor receiving signals from the central actuation unit.

5. The Laser Scanning Microscope according to claim 3 , wherein the central actuation unit provides for flexible assignment of the detection-wavelengths.

6. The beam splitter according to claim 1 , wherein at least one of the graduated filters comprises at least partially continuous spatial variation of the threshold wavelength between the reflected and the transmitted part of the detection light.

7. The beam splitter according to claim 1 , wherein at least one of the graduated filters exhibits at least in part step-wise spatial variation of the threshold wavelength between the reflected and the transmitted part of the detection light.

8. The beam splitter according to claim 1 , wherein at least one of the graduated filters is a short-pass filter, a long-pass filter or a band-pass filter.

9. The Laser Scanning Microscope according to claim 2 , further comprising means for disposing the graduated filter is a displaceable manner in the second detection beam path so as to enable variation of the optically effective threshold wavelength of the graduated filter in the second detection beam path.

10. A laser scanning microscope for viewing a sample, the laser scanning microscope comprising:

an optical axis;

means for producing illumination rays along the optical axis for illuminating the sample;

means for producing a detection beat path for wave-dependent recording of light from the sample;

filter means for selecting the detection-wavelengths, wherein at least one graduated filter spatially variable in regard to the threshold wavelength between transmission and reflection is provided in the detection beam path for the selection of the detection-wavelengths;

means for disposing the graduated filter is a displaceable manner in the detection beam path so as to enable variation of the optically effective threshold wavelength of the graduated filter;

a central actuation unit for providing variable assignment of the detection wavelengths to provide signals to control the displacement of the graduated filter; and

a motor receiving the signals from the central actuation unit for controlling the displacement of the graduated filter.

11. The beam splitter according to claim 10 , wherein the graduated filter comprises at least partially continuous spatial variation of the threshold wavelength between the reflected and the transmitted part of the detection light.

12. The beam splitter according to claim 10 , wherein the graduated filter exhibits at least in part step-wise spatial variation of the threshold wavelength between the reflected and the transmitted part of the detection light.

13. The beam splitter according to claim 10 , wherein the graduated filter is a short pass filter, a long-pass filter or a band-pass filter.

Assignments (2)
CHANGE OF NAME Recorded Jun 12, 2013
From: CARL ZEISS MICROIMAGING GMBH
To: CARL ZEISS MICROSCOPY GMBH
Reel/Frame 030592/0776 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2007
From: WOLLESCHENSKY, RALF; BATHE, WOLFGANG; STEINERT, JOERG; HUHSE, DIETER
To: CARL ZEISS MICROIMAGING GMBH
Reel/Frame 019687/0640 →