VCSEL, manufacturing method thereof, optical device, light irradiation device, data processing device, light sending device, optical spatial transmission device, and optical transmission system
View Patent ↗A VCSEL includes a first conductivity-type first semiconductor mirror layer on a substrate, an active region thereon, a second conductivity-type second semiconductor mirror layer thereon, and a current confining layer in proximity to the active region. A mesa structure is formed such that at least a side surface of the current confining layer is exposed. The current confining layer includes a first semiconductor layer having an Al-composition and a second semiconductor layer having an Al-composition and being formed nearer to the active region than the first semiconductor layer does. Al concentration of the first semiconductor layer is higher than that of the second semiconductor layer. When oscillation wavelength of laser light is λ, optical thickness being sum of the thickness of the first and second semiconductor layers is λ/4. The first and second semiconductor layers are selectively oxidized from the side surface of the mesa structure.
1. A Vertical-Cavity Surface-Emitting Laser diode (VCSEL) comprising:
a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region; and
a mesa structure formed such that at least a side surface of the current confining layer is exposed; and
the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure;
wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
2. The VCSEL according to claim 1 , wherein the second semiconductor layer in the current confining layer is formed adjacent to the active region, and the first semiconductor layer is formed adjacent to the second semiconductor layer.
3. The VCSEL according to claim 1 , wherein the current confining layer is formed in the second semiconductor mirror layer, and the first semiconductor layer is an Al x Ga 1-x As layer of the second conductivity type, and the second semiconductor layer is an Al y Ga 1-y As layer of the second conductivity type, and x>y.
4. The VCSEL according to claim 1 , wherein the current confining layer is formed in the first semiconductor mirror layer, and the first semiconductor layer is an Al x Ga 1-x As layer of the first conductivity type, and the second semiconductor layer is an Al y Ga 1-y As layer of the first conductivity type, and x>y.
5. The VCSEL according to claim 3 , wherein x of the first semiconductor layer equals to 1, and y of the second semiconductor layer is about 0.85<y<0.90.
6. The VCSEL according to claim 4 , wherein the first semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
7. The VCSEL according to claim 1 , wherein the diameter of a conductive region surrounded by an oxidized region formed in the first semiconductor layer in the current confining layer is at least equal to or smaller than 5.0 micrometers.
8. The VCSEL according to claim 1 , wherein the second semiconductor mirror layer comprises a contact layer in the uppermost layer, and an electrode layer on which an opening for emitting laser light being formed is formed on the contact layer.
9. An optical device comprising:
a VCSEL;
an electrical connecting terminal electrically coupled to the VCSEL; and
an optical component for injecting light that is emitted from the VCSEL,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
10. A light irradiation device comprising:
a VCSEL;
an optical component comprising at least one of a lens or a mirror; and
an irradiation unit for irradiating light that is emitted from the VCSEL through the optical component,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
11. A data processing device comprising:
an optical device; and
a sending unit for sending light that is emitted from the VCSEL,
the optical device including the VCSEL, an electrical connecting terminal electrically coupled to the VCSEL, and an optical component for injecting light that is emitted from the VCSEL,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
12. A light sending device comprising:
an optical device; and
a sending unit for sending light that is emitted from a VCSEL,
the optical device including the VCSEL, an electrical connecting terminal electrically coupled to the VCSEL, and an optical component for injecting light that is emitted from the VCSEL,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
13. An optical spatial transmission device comprising:
an optical device; and
a transmission unit for spatially transmitting light that is emitted from a VCSEL,
the optical device including the VCSEL, an electrical connecting terminal electrically coupled to the VCSEL, and an optical component for injecting light that is emitted from the VCSEL,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.
14. An optical transmission system comprising:
an optical device; and
a transmission unit for transmitting light that is emitted from a VCSEL,
the optical device including the VCSEL, an electrical connecting terminal electrically coupled to the VCSEL, and an optical component for injecting light that is emitted from the VCSEL,
the VCSEL including a first semiconductor mirror layer of a first conductivity type on a substrate, an active region on the first semiconductor mirror layer, a second semiconductor mirror layer of a second conductivity type on the active region, and a current confining layer in proximity to and directly on the active region, and a mesa structure formed such that at least a side surface of the current confining layer is exposed, and the current confining layer comprising a first semiconductor layer including an Al-composition and a second semiconductor layer including an Al-composition and being formed nearer to the active region than the first semiconductor layer does, the first semiconductor layer and the second semiconductor layer forming the current confining layer being directly adjacent and in contact, and Al concentration of the first semiconductor layer being higher than Al concentration of the second semiconductor layer, and optical thickness that is sum of the thickness of the first and second semiconductor layers being λ/4 when oscillation wavelength of laser light is λ, and the first and second semiconductor layers being selectively oxidized from the side surface of the mesa structure, and an end surface of an oxidized region of the second semiconductor layer being inclined relative to the side surface of the mesa structure, wherein the second semiconductor mirror layer is formed by alternately stacking a first AlGaAs layer having a high Al-composition and a second AlGaAs layer having a low Al-composition, and Al concentration of the second semiconductor layer in the current confining layer is lower than Al concentration of the first AlGaAs layer.