IP Library Granted Patent US 7,504,330
Granted Patent B2
US 7,504,330 · App. 11/882,791 · Granted Mar 17, 2009

Method of forming an insulative film

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,504,330
App. No.
11/882,791
Granted
Mar 17, 2009
Kind
B2
Abstract

A method of forming an insulative film includes a step of vacuum laminating an insulative organic material on a substrate that has a peripheral ring electrode formed in a peripheral region of the substrate and a device element(s) formed inside the peripheral region, and has a surface configuration including raised parts. A first dummy pattern is formed in a region between the peripheral ring electrode and the device element on the substrate.

Claims (22)

1. A method of forming an insulative film comprising:

preparing a substrate having a device element thereon to thereby form a raised part on the substrate,

preparing a first dummy pattern on the substrate adjacent to the device element, and

vacuum-laminating an insulative organic material on the substrate to cover the device element and the dummy pattern.

2. The method of forming an insulative film according to claim 1 , wherein said substrate further includes a peripheral ring electrode in a peripheral region of the substrate, said device element being formed inside of the peripheral region.

3. The method of forming an insulative film according to claim 2 , wherein said first dummy pattern is formed in a region between the peripheral ring electrode and the device element on the substrate.

4. The method of forming an insulative film according to claim 3 , wherein said insulative organic material is a dry film resist.

5. The method of forming an insulative film according to claim 3 , wherein said first dummy pattern is a plating pattern formed on the substrate, a through-hole pattern formed on the substrate, or a depression pattern formed by pits dug from a surface of the substrate.

6. The method of forming an insulative film according to claim 5 , wherein said first dummy pattern is a pattern of a rectangle or a pattern of an ellipse, each of said pattern having a longitudinal direction at right angle, or parallel to an edge line of the peripheral ring electrode, or combination thereof.

7. The method of forming an insulative film according to claim 5 , wherein said first dummy pattern is a pattern of a square or a pattern of a circle.

8. The method of forming an insulative film according to claim 7 , wherein said first dummy pattern is a pattern comprising a plurality of squares or circles arranged in a lattice.

9. The method of forming an insulative film according to claim 6 , wherein said first dummy pattern and the device element are formed to have a distance substantially equal to a distance between device elements formed on the substrate.

10. The method of forming an insulative film according to claim 4 , wherein said first dummy pattern comprises a combination of patterns selected from a plating pattern formed on the substrate, a through-hole pattern formed on the substrate, and a depression pattern formed by pits dug from a surface of the substrate.

11. The method of forming an insulative film according to claim 3 , wherein said first dummy pattern is formed to have a same configuration as a part or a whole of a pattern of the device element, the first dummy pattern having a same repetition period as a repetition period of device elements formed on the substrate.

12. The method of forming an insulative film according to claim 1 , wherein said first dummy pattern is formed in a side region of the device element.

13. The method of forming an insulative film according to claim 2 , wherein said first dummy pattern is formed in a side region of the device element.

14. A method of forming an insulative film according to claim 3 , further comprising forming a second dummy pattern in a side region of the device element.

15. The method of forming an insulative film according to claim 12 , wherein said insulative organic material is a dry film resist.

16. The method of forming an insulative film according to claim 12 , wherein said first dummy pattern is a plating pattern formed on the substrate.

17. The method of forming an insulative film according to claim 16 , wherein said plating pattern is a rectangular pattern arranged parallel to the side region of the device element.

18. The method of forming an insulative film according to claim 16 , wherein said plating pattern has a triangular shape or a trapezoidal shape.

19. The method of forming an insulative film according to claim 16 , wherein said plating pattern is composed of a, plurality of components, said components having approximately rectangular shape.

Assignments (4)
MERGER AND CHANGE OF NAME Recorded Aug 26, 2011
From: FUJI ELECTRIC SYSTEMS CO., LTD. (FES); FUJI TECHNOSURVEY CO., LTD. (MERGER BY ABSORPTION)
To: FUJI ELECTRIC CO., LTD.
Reel/Frame 026970/0872 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2010
From: FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
To: FUJI ELECTRIC SYSTEMS CO., LTD.
Reel/Frame 024252/0438 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2009
From: FUJI ELECTRIC HOLDINGS CO., LTD.
To: FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
Reel/Frame 022980/0835 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2007
From: HIROSE, TAKAYUKI; EDO, MASAHARU; SATO, AKIRA
To: FUJI ELECTRIC HOLDINGS CO., LTD.
Reel/Frame 020014/0021 →