IP Library Granted Patent US 7,765,087
Granted Patent B2
US 7,765,087 · App. 11/887,485 · Granted Jul 27, 2010

System performance profiling device integrated inside a system-on-chip

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Quick Facts
Patent No.
US 7,765,087
App. No.
11/887,485
Granted
Jul 27, 2010
Kind
B2
Abstract

A system performance profiling device is provided inside a system-on-chip (SoC). Selectors respectively select values of predetermined bit positions of counters and output the selected values to the outside of the system-on-chip, during a period of acquisition of profiling data. When the acquisition of the profiling data ends, the selectors respectively select values of all lower bit positions of the counters than the predetermined bit positions, and output the selected values to the outside of the system-on-chip.

Claims (24)

1. A system performance profiling device that is integrated inside a system-on-chip, monitors a signal on a bus inside the system-on-chip, acquires profiling data for evaluating system performance of the system-on-chip, and outputs the profiling data to an outside of the system-on-chip, the system performance profiling device comprising:

a command detection unit operable to detect a command occurrence by monitoring the signal on the bus;

a data detection unit operable to detect a data transfer by monitoring the signal on the bus;

a first counter unit operable to count a number of command occurrences based on a result of the detection by the command detection unit;

a second counter unit operable to count a number of data transfers based on a result of the detection by the data detection unit;

a first selector unit operable to output a value of a first bit position, which is one bit position of the first counter unit, to the outside of the system-on-chip during a period of acquisition of the profiling data, and output a value of each lower bit position of the first counter unit than the first bit position to the outside of the system-on-chip after the acquisition of the profiling data ends; and

a second selector unit operable to output a value of a second bit position, which is one bit position of the second counter unit, to the outside of the system-on-chip during the period of the acquisition of the profiling data, and output a value of each lower bit position of the second counter unit than the second bit position to the outside of the system-on-chip after the acquisition of the profiling data ends.

2. The system performance profiling device of claim 1 , further comprising:

a bit position setting unit operable to set the first bit position of the first counter unit.

3. The system performance profiling device of claim 1 , further comprising:

a bit position setting unit operable to set the second bit position of the second counter unit.

4. The system performance profiling device of claim 1 , further comprising:

a counting suppression unit operable to suppress the counting by the second counter unit, until data transfers corresponding to all commands that occur before the acquisition of the profiling data starts are completed.

5. The system performance profiling device of claim 4 , wherein

after the acquisition of the profiling data ends, the second selector unit outputs a number of commands corresponding to data transfers that have not been completed at a time when the acquisition of the profiling data ends, to the outside of the system-on-chip before or after outputting the value of each lower bit position of the second counter unit than the second bit position.

6. The system performance profiling device of claim 4 , wherein

after the acquisition of the profiling data ends, the first selector unit outputs a number of commands corresponding to data transfers that have not been completed at a time when the acquisition of the profiling data ends, to the outside of the system-on-chip before or after outputting the value of each lower bit position of the first counter unit than the first bit position.

7. The system performance profiling device of claim 4 , wherein

the data detection unit and the second counter unit continue respective operations until data transfers corresponding to all commands that occur after the acquisition of the profiling data starts are completed, and

the second selector unit outputs the value of the second bit position to the outside of the system-on-chip until the data transfers corresponding to all commands that occur after the acquisition of the profiling data starts are completed, and outputs the value of each lower bit position of the second counter unit than the second bit position to the outside of the system-on-chip after the data transfers corresponding to all commands that occur after the acquisition of the profiling data starts are completed.

8. The system performance profiling device of claim 1 , further comprising:

a condition setting unit operable to set a condition for a bus transaction that is subjected to the acquisition of the profiling data,

wherein the first counter unit counts a number of occurrences of commands that satisfy the condition set by the condition setting unit, and

the second counter unit counts a number of data transfers that satisfy the condition set by the condition setting unit.

Assignments (2)
CHANGE OF NAME Recorded Nov 11, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021818/0725 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2008
From: KANZAKI, HIDEYUKI; NISHIMURA, KOZO; TANAKA, YOSHIHISA
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 021513/0922 →