IP Library Granted Patent US 7,741,705
Granted Patent B2
US 7,741,705 · App. 11/889,830 · Granted Jun 22, 2010

Semiconductor device and method of producing the same

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Quick Facts
Patent No.
US 7,741,705
App. No.
11/889,830
Granted
Jun 22, 2010
Kind
B2
Abstract

A semiconductor device includes a semiconductor substrate having an internal circuit; an electrode pad electrically connected to the internal circuit; an insulating film having a through hole exposing the electrode pad; and a re-distribution wiring pattern formed on the insulating film and electrically connected to the electrode pad. The semiconductor device further includes a recess groove formed in the insulating film around and adjacent to the re-distribution wiring pattern.

Claims (12)

1. A semiconductor device, comprising:

a semiconductor substrate having an internal circuit;

an electrode pad electrically connected to the internal circuit;

an insulating film having a through hole exposing the electrode pad;

a re-distribution wiring pattern formed on the insulating film and electrically connected to the electrode pad;

a recess groove formed in the insulating film, said recess groove being situated outside the re-distribution wiring pattern and disposed adjacent to an edge of the re-distribution wiring pattern; and

a sealing layer filled in the recess groove and covering the re-distribution wiring pattern so that the sealing layer directly contacts with the recess groove.

2. The semiconductor device according to claim 1 , wherein said recess groove has a depth smaller than a thickness of the insulating film.

3. The semiconductor device according to claim 1 , wherein said recess groove is disposed in an area between the re-distribution wiring pattern and an adjacent re-distribution wiring pattern.

4. The semiconductor device according to claim 1 , wherein said insulating film is formed of an insulating resin material with photosensitivity.

5. The semiconductor device according to claim 1 , further comprising a metal base layer, said re-distribution wiring pattern being formed on the insulating film with the metal base layer inbetween.

6. The semiconductor device according to claim 1 , further comprising a post electrode formed on the re-distribution wiring pattern.

Assignments (2)
CHANGE OF NAME Recorded Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →
CHANGE OF NAME Recorded Jan 22, 2009
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022162/0669 →