IP Library Granted Patent US 8,287,653
Granted Patent B2
US 8,287,653 · App. 11/898,836 · Granted Oct 16, 2012

Debris removal in high aspect structures

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Quick Facts
Patent No.
US 8,287,653
App. No.
11/898,836
Granted
Oct 16, 2012
Kind
B2
Abstract

A method of debris removal is provided. The method includes positioning a nanometer-scaled tip adjacent to a piece of debris on a substrate. The method also includes adhering the piece of debris to the tip. In addition, the method also includes removing the piece of debris from the substrate by moving the tip away from the substrate.

Claims (18)

1. A method for removing debris from a trench formed on a surface of a substrate, comprising:

positioning a tip, having a nanometer-scaled coating with a surface energy lower than the surface energy of the substrate, within the trench;

moving the tip within the trench to physically adhere the debris to the tip;

moving the tip with the adhered debris away from the trench; and

imbedding the debris in a patch of material, attached to a stage that supports the substrate, having a surface energy lower than the surface energy of the debris.

2. The method of claim 1 , wherein the tip coating is polytetrafluoroethylene.

3. The method of claim 1 , further comprising replenishing the tip coating by plunging the tip into the patch of material.

4. The method of claim 3 , wherein the replenishing step includes moving the tip laterally along the patch of material.

5. The method of claim 1 , further comprising using the patch to push the debris away from an apex of the tip and toward an atomic force microscope cantilever that supports the tip.

6. The method of claim 1 , wherein the tip coating is a metallic material.

7. A system for removing debris from a surface of a substrate, comprising:

an atomic force microscope, including:

a cantilever, and

a tip, supported by the cantilever, having a nanometer-scaled coating with a surface energy lower than the surface energy of the substrate; and

a patch of material, attached to a stage that supports the substrate, having a surface energy lower than the surface energy of the debris.

8. The system of claim 7 , wherein the tip coating is polytetrafluoroethylene.

9. The system of claim 7 , wherein the tip coating is a metallic material.

10. The system of claim 7 , wherein the patch of material is removably attached to the substrate stage.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2019
From: RAVE LLC; RAVE N.P., INC.; RAVE DIAMOND TECHNOLOGIES INC.
To: BRUKER NANO, INC.
Reel/Frame 050996/0307 →
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2019
From: AVIDBANK SPECIALTY FINANCE, A DIVISION OF AVIDBANK
To: RAVE LLC
Reel/Frame 048886/0593 →
RELEASE OF SECURITY INTEREST Recorded Nov 15, 2013
From: BRIDGE BANK, NATIONAL ASSOCIATION
To: RAVE LLC
Reel/Frame 031616/0324 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: RAVE LLC
To: AVIDBANK CORPORATE FINANCE, A DIVISION OF AVIDBANK
Reel/Frame 031597/0532 →
SECURITY AGREEMENT Recorded Sep 1, 2011
From: RAVE LLC
To: BRIDGE BANK, NATIONAL ASSOCIATION
Reel/Frame 026843/0503 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2008
From: ROBINSON, TOD EVAN; ARRUZA, BERNABE J.; ROESSLER, KENNETH GILBERT
To: RAVE, LLC
Reel/Frame 020482/0290 →