Vertical indent production repair

1. A method of nanomachining, the method comprising:

plunging a nanometer-scaled tip into a surface of a substrate at a first location in a first direction that is substantially perpendicular to the surface, thereby displacing a first portion of the substrate with the tip;

withdrawing the tip from the substrate in a second direction that is substantially opposite to the first direction;

moving at least one of the tip and the substrate laterally relative to each other;

plunging the tip into the substrate at a second location in a third direction that is substantially parallel to the first direction, thereby displacing a second portion of the substrate with the tip; and

withdrawing the tip from the substrate in a fourth direction that is substantially opposite to the third direction.

2. The method of claim 1 , wherein the second location is located substantially immediately below the first location.

3. The method of claim 1 , where in the second location is adjacent to the first location.

4. The method of claim 3 , further comprising:

plunging the tip into the substrate at a third location, wherein the third location is adjacent to the second location, and wherein the first, second, and third locations are spaced at a substantially regular interval.

5. The method of claim 3 , further comprising:

plunging the tip into the substrate at a third location, wherein the third location is adjacent to the second location, and wherein the first, second, and third locations are spaced at an irregular interval.

6. The method of claim 1 , wherein the substrate comprises a photolithography mask.

7. The method of claim 1 , further comprising:

substantially preventing deflection of the tip during either of the plunging steps.

8. The method of claim 1 , further comprising:

plunging the tip into the surface at a plurality of additional locations about a perimeter of a desired pattern.

9. The method of claim 8 , further comprising:

ejecting material within the perimeter.

10. The method of claim 8 , further comprising:

plunging the tip into the surface at a plurality of additional locations about an interior portion of the desired pattern.

11. The method of claim 1 , further comprising:

cleaning the substrate.

12. The method of claim 2 , further comprising:

matching an angle of a reference sidewall in the substrate.

13. The method of claim 1 , wherein the tip is asymmetrically shaped.

14. The method of claim 13 , wherein the tip is substantially triangularly shaped, and wherein one side of the tip is positioned substantially perpendicular to the substrate.

15. The method of claim 2 , further comprising:

forming a substantially straight vertical wall in the substrate pursuant to the plunging steps.

16. The method of claim 15 , further comprising:

removing a protrusion from an otherwise substantially vertical wall using additional plunging and removing steps.

17. The method of claim 16 , further comprising:

removing additional material beneath the protrusion once the protrusion has been removed.

18. The method of claim 8 , further comprising:

defining an interior plunge perimeter wherein the tip has a relatively deep effect on a substrate pursuant to plunging; and

determining a number of plunges to be made about the perimeter of the desired pattern by maximizing the number of plunges that have their interior plunge perimeters in contact with the perimeter of the desired pattern.

19. The method of claim 18 , further comprising:

utilizing image-recognition software to perform the determining step in an automated manner.

20. The method of claim 1 , further comprising:

simultaneously plunging a second nanometer-scaled tip into the surface of a substrate at a third location of the substrate.