IP Library Granted Patent US 7,869,187
Granted Patent B2
US 7,869,187 · App. 11/899,062 · Granted Jan 11, 2011

Acoustic bandgap structures adapted to suppress parasitic resonances in tunable ferroelectric capacitors and method of operation and fabrication therefore

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Quick Facts
Patent No.
US 7,869,187
App. No.
11/899,062
Granted
Jan 11, 2011
Kind
B2
Abstract

An acoustic bandgap structure can include a stack of at least three ferroelectric layers with a top side and bottom side of each of the ferroelectric layers contacting an electrode layer, where the ferroelectric layers and the electrode layers form a substantially periodic structure in the direction normal to the ferroelectric and electrode layers and where an acoustic characteristic impedance and thickness of each layer are selected to realize an acoustic bandgap over a desired frequency band for the purpose of improving the device Q.

Claims (23)

1. An apparatus, comprising:

a stack of at least three ferroelectric layers with a top side and bottom side of each of said ferroelectric layers contacting an electrode layer;

wherein said ferroelectric layers and said electrode layers form a substantially periodic structure in the direction normal to said ferroelectric and electrode layers;

wherein an acoustic characteristic impedance and thickness of each layer are selected to realize an acoustic bandgap over a desired frequency band; and

wherein a subset of the electrode and ferroelectric layers are rendered acoustically inert by shorting the electrode layers.

2. The apparatus of claim 1 , wherein all ferroelectric layers except for one layer are rendered acoustically inert by electrically shorting the electrodes on opposite sides of a given ferroelectric layer.

3. The apparatus of claim 2 , wherein said electrically shorting is accomplished by conductive vias.

4. The apparatus of claim 1 , wherein all ferroelectric layers except for two layers are rendered acoustically inert by electrically shorting the electrodes on opposite sides of a given ferroelectric layer.

5. The apparatus of claim 1 , wherein said electrodes are metal layers and wherein said metal layers have essentially the same acoustic characteristic impedance and the same thickness.

6. The apparatus of claim 1 , wherein said ferroelectric layers have essentially the same acoustic characteristic impedance and the same thickness.

7. The apparatus of claim 1 , wherein said electrode layers are each comprised of multiple sublayers.

8. The apparatus of claim 1 , further comprising at least one additional passivation layer and at least one final metal interconnect layers used for wire bonding or flip-chip attachment to the next level of assembly.

9. A tunable ferroelectric capacitor, comprising:

a multilayer one dimensional periodic structure containing multiple unit cells, wherein each unit cell contains a plurality of ferroelectric layers with layers of low and high acoustic characteristic impedance;

wherein the acoustic impedances of individual layers in said unit cells are selected to produce an acoustic bandgap for a desired frequency band; and

wherein a subset of electrode layers and the ferroelectric layers are rendered acoustically inert by shorting the electrode layers.

10. The tunable ferroelectric capacitor of claim 9 , wherein at least one of said plurality of ferroelectric layers is contacted on both sides by conductive electrode layers.

11. The tunable ferroelectric capacitor of claim 9 , wherein all the ferroelectric layers except for one or two layers are rendered acoustically inert.

12. The tunable ferroelectric capacitor of claim 11 , wherein said electrically shorting is accomplished by conductive vias.

13. The tunable ferroelectric capacitor of claim 10 , wherein said electrodes are metal layers and wherein said metal layers have essentially the same acoustic characteristic impedance and the same thickness.

14. The tunable ferroelectric capacitor of claim 9 , wherein said plurality of ferroelectric layers have essentially the same acoustic characteristic impedance and the same thickness.

15. The tunable ferroelectric capacitor of claim 9 , wherein said electrode layers are each comprised of multiple sublayers.

16. The tunable ferroelectric capacitor of claim 9 , further comprising at least one additional passivation layer and at least one final metal interconnect layer used for wire bonding or flip-chip attachment to the next level of assembly.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 5, 2020
From: BLACKBERRY LIMITED
To: NXP USA, INC.
Reel/Frame 052095/0443 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2013
From: RESEARCH IN MOTION RF, INC.
To: RESEARCH IN MOTION CORPORATION
Reel/Frame 030909/0908 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2013
From: RESEARCH IN MOTION CORPORATION
To: BLACKBERRY LIMITED
Reel/Frame 030909/0933 →
CHANGE OF NAME Recorded Jul 31, 2012
From: PARATEK MICROWAVE, INC.
To: RESEARCH IN MOTION RF, INC.
Reel/Frame 028686/0432 →