Defect inspection method of magnetic disk, device therefor, and magnetic disk drive device
View Patent ↗Embodiments of the present invention efficiently conduct a test for detecting defects on a magnetic disk more accurately. According to one embodiment, a HDD carries out defect inspection of a magnetic disk using thermal fly height control (TFC). Changing a clearance by the TFC achieves defect inspection tests under varied test conditions without much decrease of throughput in manufacturing HDDs. First, a self analysis test (SAT) is carried out in a state that a heater power of P 2 is supplied to a heater. Then, another SAT is carried out in a state that a heater power of P 1 is supplied to the heater. The heater power P 2 is larger than the heater power P 1.
1. A method for inspecting the magnetic disk for defects in a magnetic disk drive device comprising a slider flying over a rotating magnetic disk, a head element portion placed on the slicer, a heater placed on the slider and making the head element portion protrude by a thermal expansion to adjust a clearance between the magnetic disk and the head element portion, the method comprising:
conducting a defect inspection of a recording surface of the magnetic disk with the head element portion accessing the recording surface in a state that a heater power value of the heater is a first value; and
conducting a defect inspection of the recording surface of the magnetic disk with the head element portion accessing the recording surface in a state that the heater power value of the heater is a second value which is different from the first value.
2. The method according to claim 1 , wherein the defect inspection with the second value is conducted with respect to a part of a region selected from the region on which the defect inspection with the first value was conducted.
3. The method according to claim 2 , wherein the first value is larger than the second value.
4. The method according to claim 3 , further comprising preliminarily registering at least a part of the defects detected in the inspection in the state that the heater power of the heater is the first value as defect candidates.
5. The method according to claim 2 , wherein the part of the region is selected based on a result of the defect inspection with the first value.
6. The method according to claim 2 , wherein the part of the region is selected based on a density of the defects which are detected in the defect inspection with the first value.
7. The method according to claim 1 , wherein
the first value is larger than the heater power value at a normal operation of the magnetic disk drive device at a same temperature as the inspection; and
the second value is smaller than the heater power value at the normal operation of the magnetic disk drive device at a same temperature as the inspection.
8. A device for inspecting a magnetic disk for defects comprising:
a slider flying over a rotating magnetic disk;
a head element portion placed on the slider;
a heater placed on the slider and making the head element portion protrude by a thermal expansion to adjust a clearance between the magnetic disk and the head element portion; and
a controller conducting a defect inspection of the magnetic disk with the head element portion accessing a recording surface of the magnetic disk in a state that a heater power value of the heater is a first value, and further conducting a defect inspection of the recording surface with the head element portion accessing the recording surface in a state that a heater power value of the heater is a second value which is different from the first value.
9. The device according to claim 8 , wherein the controller conducts the defect inspection with the second value with respect to a part of a region selected from the region on which the defect inspection was conducted with the first value.
10. The device according to claim 9 , wherein the first value is larger than the second value.
11. A magnetic disk drive device comprising:
a slider flying over a rotating magnetic disk;
a head element portion placed on the slider;
a heater placed on the slider and making the head element portion protrude by a thermal expansion to adjust a clearance between the magnetic disk and the head element portion; and
a controller conducting a defect inspection of the magnetic disk with the head element portion accessing the magnetic disk in a state that a heater power value of the heater is different from a heater power value at a normal operation.
12. The magnetic disk drive device according to claim 11 , wherein the heater power value at the defect inspection is smaller than the heater power value at the normal operation.
13. The magnetic disk drive according to claim 11 , wherein the controller conducts the defect inspection on sectors preliminarily registered as defect candidates.