IP Library Granted Patent US 7,766,715
Granted Patent B2
US 7,766,715 · App. 11/910,108 · Granted Aug 3, 2010

Method of manufacturing plasma display panel and setter for substrate used therein

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Quick Facts
Patent No.
US 7,766,715
App. No.
11/910,108
Granted
Aug 3, 2010
Kind
B2
Abstract

In a method of manufacturing a PDP, in which a glass substrate on which a panel structure member precursor is formed is put on a setter and the panel structure member precursor is fired/solidified, the setter mainly includes a material obtained by coupling silicon carbide and silicon nitride, and a difference between a linear expansion coefficient of the setter and a linear expansion coefficient of the glass substrate is 5×10 −6 /K or less.

Claims (20)

1. A method of manufacturing a plasma display panel, the method comprising:

firing and solidifying a front panel structure member precursor so as to manufacture a front panel structure member after putting a front glass substrate on a first setter, the front glass substrate being provided with the front panel structure member precursor on a surface thereof;

firing and solidifying a rear panel structure member precursor so as to manufacture a rear panel structure member after putting a rear glass substrate on a second setter, the rear glass substrate being provided with the rear panel structure member precursor on a surface thereof;

sealing and bonding peripheries of the front glass substrate and the rear glass substrate after facing the front panel structure member and the rear panel structure member; and

filling discharge gas in a space formed between the front glass substrate and the rear glass substrate,

wherein the first setter mainly includes a silicon composite material obtained by coupling silicon carbide and silicon nitride, and a difference between a linear expansion coefficient of the first setter and a linear expansion coefficient of the front glass substrate is at most 5×10 −6 /K.

2. The method according to claim 1 , wherein a content of silicon carbide of the first setter is more than 0 wt % and at most 44.4 wt %.

3. The method according to claim 2 , wherein heat conductivity of the first support is at least 20 W/mK.

4. The method according to claim 1 , wherein heat conductivity of the first setter is at least 20 W/mK.

5. The method according to claim 4 , wherein a content of silicon carbide of the first setter is at least 26.3 wt % and at most 44.4 wt %.

6. The method according to claim 1 , wherein the second setter mainly includes a material obtained by coupling silicon carbide and silicon nitride, a difference between a linear expansion coefficient of the second setter and a linear expansion coefficient of the rear glass substrate is at most 5×10 −6 /K.

7. The method according to claim 6 , wherein a content of silicon carbide of the second setter is more than 0 wt % and at most 44.4 wt %.

8. The method according to claim 7 , wherein heat conductivity of the second support is at least 20 W/mK.

9. The method according to claim 6 , wherein heat conductivity of the second setter is at least 20 W/mK.

10. The method according to claim 9 , wherein a content of silicon carbide of the second setter is at least 26.3 wt % and at most 44.4 wt %.

11. A setter for a substrate of a plasma display panel, on which a glass substrate is put when the glass substrate on which a panel structure member precursor is formed is fired and solidified, the setter mainly comprising a silicon composite material obtained by coupling silicon carbide and silicon nitride, a difference between a linear expansion coefficient of the setter and a linear expansion coefficient of the glass substrate being at most 5×10 −6 /K.

12. The setter according to claim 11 , wherein a content of silicon carbide is more than 0 wt % and at most 44.4 wt %.

13. The support according to claim 12 , wherein heat conductivity is at least 20 W/mK.

14. The setter according to claim 11 , wherein heat conductivity is at least 20 W/mK.

15. The setter according to claim 14 , wherein a content of silicon carbide is at least 26.3 wt % and at most 44.4 wt %.

Assignments (1)
CHANGE OF NAME Recorded Nov 11, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021818/0725 →