Accessory for attenuated total internal reflective (ATR) spectroscopy
View Patent ↗An accessory for use with a microscope arranged to carry out ATR measurements has a support ( 40 ) which can be fixed to the moveable stage ( 20 ) of the microscope. A mounting member ( 100 ) is carried by the support ( 40 ). A sample supporting member ( 60 ) is disposed below the location of the ATR crystal ( 106 ). The sample supporting member ( 60 ) is carried on the support ( 40 ) such that it can be moved to restricted extent relative to the support and defines a sub-stage which can be moved relative to the main stage ( 20 ) of the microscope.
1. A device comprising:
a support constructed and arranged to be coupled to a movable stage of a microscope;
a mounting member on the support, the mounting member constructed and arranged to receive an attenuated total reflectance crystal at a first location;
a sample supporting member disposed below the first location and on the support, the sample supporting member configured to be moveable relative to the first location; and
a location adjustor configured to adjust a position of the sample supporting member on the support, the location adjustor comprising a pair of screws constructed and arranged to position the sample supporting member against a biasing spring,
wherein a surface against which each screw acts is inclined at an angle to an axis of the crystal, whereby each screw is constructed and arranged to position the sample supporting member towards the support.
2. The device of claim 1 , in which the sample supporting member comprises a substantially flat upper surface and side surfaces.
3. The device of claim 1 , in which the screws are constructed and arranged to act along orthogonal directions and the biasing spring is constructed and arranged to act along a bisector of the orthogonal directions.
4. A microscope, comprising:
an objective cassegrain;
a condenser cassegrain;
a moveable stage between the objective cassegrain and the condenser cassegrain; and
an accessory device coupled to the moveable stage, the accessory device comprising:
a support coupled to the movable stage;
a mounting member on the support, the mounting member configured to receive an attenuated total reflectance crystal at a first location;
a sample supporting member disposed below the first location and on the support, the sample supporting member configured to be moveable relative to the first location; and
a location adjustor configured to adjust a position of the sample supporting member on the support, the location adjustor comprising a pair of screws constructed and arranged to position the sample supporting member against a biasing spring,
wherein a surface against which each screw acts is inclined at an angle to an axis of the crystal, whereby each screw is constructed and arranged to position the sample supporting member towards the support.
5. The microscope of claim 4 , further comprising an optic device optically coupled to at least one of the objective cassegrain and the condenser cassegrain.
6. The microscope of claim 5 , further comprising a detector optically coupled to the optic device.
7. The microscope of claim 6 , further comprising at least one minor optically coupled to at least one of the objective cassegrain and the condenser cassegrain.
8. The microscope of claim 7 , in which the microscope is configured to operate in a reflectance mode.
9. The microscope of claim 4 , in which the sample supporting member comprises a substantially flat upper surface and side surfaces.
10. The microscope of claim 4 , in which the screws are constructed and arranged to act along orthogonal directions and the biasing spring is constructed and arranged to act along a bisector of the orthogonal directions.
11. A microscope, comprising:
a moveable stage; and
an accessory device coupled to the moveable stage, the accessory device comprising:
a support coupled to the movable stage;
a mounting member on the support and configured to receive an attenuated total reflectance crystal at a first location;
a sample supporting member disposed below the first location and on the support, the sample supporting member configured to be moveable relative to the first location; and
a location adjustor configured to adjust a position of the sample supporting member on the support, the location adjustor comprising a pair of screws constructed and arranged to position the sample supporting member against a biasing spring,
wherein a surface against which each screw acts is inclined at an angle to an axis of the crystal, whereby each screw is constructed and arranged to position the sample supporting member towards the support.