Accessory for attenuated total internal reflectance (ATR) spectroscopy
View Patent ↗An accessory for use with a microscope arranged to carry out ATR measurements has a support ( 40 ) which can be mounted on the moveable stage of the microscope. A mounting ( 100 ) for an ATR crystal ( 106 ) is carried on the support. A sample supporting member ( 60 ) is disposed below the location of the ATR crystal. The sample supporting member ( 60 ) has a relatively thin upper wall ( 64 ). A pressure applying mechanism ( 80 ) is located below the wall ( 64 ) and is operable to apply pressure to a sample through the wall ( 64 ) to ensure good contact between a sample and the sample contacting surface of the crystal.
1. A device comprising:
a support constructed and arranged to be coupled to a movable stage of a microscope;
a mounting member on the support, the mounting member configured to receive an attenuated total reflectance crystal at a first location;
a sample supporting member on the support, disposed below the first location and movable relative to the mounting member; and
a pressure applicator on the support and disposed below the sample supporting member, the pressure applicator configured to apply pressure to the sample supporting member in a direction of the attenuated total reflectance crystal.
2. The device of claim 1 , wherein the sample supporting member is moveable, relative to the pressure applicator, transversely to said direction.
3. The device of claim 1 , wherein the pressure applicator comprises a spherical member configured to apply pressure to the sample supporting member.
4. The device of claim 1 , wherein the pressure applicator comprises a spring.
5. The device of claim 3 , wherein the pressure applicator comprises a spring.
6. The device of claim 4 , wherein the pressure applicator further comprises a plunger that is constructed and arranged to be urged towards the crystal by the spring.
7. The device of claim 6 , wherein the pressure applicator comprises a spherical member configured to apply pressure to the sample supporting member, the spherical member comprises a ball bearing, and the plunger is configured to contact the ball bearing.
8. The device of claim 7 , further comprising a rack and pinion device coupled to the plunger, in which the rack is configured for movement to effect rotation of the pinion and cause axial movement of the plunger to apply pressure to the sample support member.
9. The device of claim 8 , wherein the pressure applied to the sample support member by the pressure applicator is adjustable.
10. The device of claim 9 , in which the sample support member is configured to be proximal to the pressure applicator.
11. A microscope comprising:
an objective cassegrain;
a condenser cassegrain;
a moveable stage between the objective cassegrain and the condenser cassegrain; and
an accessory device coupled to the moveable stage, the accessory device comprising:
a support coupled to the movable stage;
a mounting member on the support, the mounting member configured to receive an attenuated total reflectance crystal at a first location;
a sample supporting member on the support and disposed below the first location, the sample supporting member movable relative to the mounting member; and
a pressure applicator on the support and disposed below the sample supporting member, the pressure applicator configured to apply pressure to the sample supporting member in a direction of the attenuated total reflectance crystal.
12. The microscope of claim 11 , wherein the sample supporting member is moveable, relative to the pressure applicator, transversely to said direction.
13. The microscope of claim 11 , further comprising an optic device optically coupled to at least one of the objective cassegrain and the condenser cassegrain.
14. The microscope of claim 13 , further comprising a detector optically coupled to the optic device.
15. The microscope of claim 14 , further comprising at least one mirror optically coupled to at least one of the objective cassegrain and the condenser cassegrain.
16. The microscope of claim 11 , in which the microscope is configured to operate in a reflectance mode.
17. The microscope of claim 11 , wherein the pressure applicator comprises a spherical member configured to apply pressure to the sample supporting member.
18. The microscope of claim 11 , wherein the pressure applicator comprises a spring.
19. The microscope of claim 11 , wherein the pressure applied to the sample support member by the pressure applicator is adjustable.
20. A microscope comprising:
a moveable stage; and
an accessory device coupled to the moveable stage, the accessory device comprising:
a support coupled to the movable stage of the microscope;
a mounting member on the support, the mounting member configured to receive an attenuated total reflectance crystal at a first location;
a sample supporting member on the support, disposed below the first location and moveable relative to the mounting member; and
a pressure applicator on the support and disposed below the sample supporting member, the pressure applicator configured to apply pressure to the sample supporting member in a direction of the attenuated total reflectance crystal.
21. The microscope of claim 20 , in which the pressure applicator comprises a spherical member configured to apply pressure to the sample supporting member.
22. The microscope of claim 20 , in which the pressure applicator comprises a spring.
23. The microscope of claim 20 , wherein the sample supporting member is moveable, relative to the pressure applicator, transversely to said direction.