A METHOD FOR TESTING IN A RECONFIGURABLE TESTER

1 . A method for testing in a reconfigurable tester, the method comprising:

simulating a functional operational environment for a first type device-under-test with a tester, comprising:

recognizing a non-deterministic response signal comprising a predetermined protocol;

receiving the non-deterministic response signal from the first type device-under-test;

ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on the predetermined protocol; and

initiating transmission of the expected stimulus signal to the first type device-under-test; and

simulating a functional operational environment for a second type device-under-test with the tester after testing the first type device-under-test.

2 . The method for testing of claim 1 further comprising storing the non-deterministic response signal within a response capture storage device.

3 . The method for testing of claim 2 , wherein storing comprises storing the non-deterministic response signal within at least one of: 1) FIFO memory; or 2) random access memory.

4 . The method for testing of claim 2 further comprising evaluating the non-deterministic response signal to determine if the non-deterministic response signal is correctly transmitted from the first type device-under-test to determine an operational condition of the first type device-under-test.

5 . The method for testing of claim 4 further comprising:

retaining at least one expected stimulus signal in an expected stimulus signal storage device; and

initiating selection of the at least one expected stimulus signal; and

describing a synchronizing timing and a latency delay at which the expected stimulus signal is to be transmitted to the first type device-under-test.

6 . The method for testing of claim 5 , wherein retaining the at least one expected stimulus signal comprises retaining the at least one expected stimulus signal in at least one of: a) FIFO memory; or b) random access memory.

7 . The method for testing of claim 5 further comprising:

generating from an encoded stimulus data the expected stimulus signal for storage in the expected stimulus signal storage device.

8 . The method for testing of claim 7 further comprising:

managing transfer of the non-deterministic response signal from the response capture storage device based on the non-deterministic response signal when receiving a non-deterministic response signal; and

managing transfer of the deterministic response signal from the response capture storage device to determine that the first type device-under-test is operating correctly from the deterministic response signal when receiving a deterministic response signal.

9 . The method for testing of claim 8 further comprising:

managing the transfer of the expected stimulus signal to the expected stimulus signal storage device based on the non-deterministic response signal when receiving a non-deterministic response signal; and

transferring a deterministic stimulus signal when control of the transfer of the deterministic stimulus signal is independent of operational signals from the first type device-under-test.

10 . The method for testing of claim 9 , wherein ascertaining an expected stimulus signal to be transferred to the first type device-under-test from the non-deterministic response signal based on a predetermined protocol comprises selecting the predetermined protocol from at least one of: a) a random access memory interface protocol; b) a communication interface protocol; or c) a computing device interface protocol.

11 . The method for testing of claim 1 , wherein simulating the functional operational environment for the first type device-under-test comprises configuring the tester to recognize a non-deterministic response signal comprising a plurality of predetermined protocols.

12 . The method for testing of claim 1 further comprising:

receiving a response signal from the first type device-under-test;

ascertaining whether the response signal is a deterministic response signal; and

passing deterministic response signals for comparison with expected responses to determine whether the first type device-under-test is functioning correctly.

13 . The method for testing of claim 1 wherein simulating a functional operational environment for a second type device-under-test comprises reprogramming the tester to recognize and respond to a non-deterministic response signal from the second type device-under-test comprising a predetermined protocol.

14 . A method for simulating a functional operational environment in a reconfigurable automated tester comprising:

configuring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal for transfer to a first type SOC device-under-test from a non-deterministic response signal based on a predetermined protocol for the first type SOC device-under-test; and

reconfiguring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal for transfer to a second type SOC device-under-test from a non-deterministic response signal based on a predetermined protocol for the second type SOC device-under-test.

15 . The method for simulating a functional operational environment of claim 14 , wherein configuring comprises programming a programmable circuit to respond to the predetermined protocol of the first type SOC device-under-test.

16 . The method for simulating a functional operational environment of claim 15 , wherein configuring comprises programming a field programmable gate array to respond to the predetermined protocol of the first type SOC device-under-test.

17 . The method for simulating a functional operational environment of claim 15 , wherein reconfiguring comprises reprogramming the programmable circuit to respond to the predetermined protocol of the second type SOC device-under-test.

18 . The method for simulating a functional operational environment of claim 17 , wherein configuring comprises programming a field programmable gate array to respond to the predetermined protocol of the second type SOC device-under-test.

19 . The method for simulating a functional operational environment of claim 14 further comprising reconfiguring the reconfigurable automated tester to be capable of ascertaining an expected stimulus signal to be transferred to a third type SOC device-under-test from a non-deterministic response signal based on a plurality of predetermined protocols for the third type SOC device-under-test.

20 . The method for simulating a functional operational environment of claim 14 further comprising storing the non-deterministic response signal within a response capture storage device.

21 . The method for simulating a functional operational environment of claim 20 , wherein storing comprises storing the non-deterministic response signal in at least one of: a) FIFO memory; or b) random access memory.

22 . The method for simulating a functional operational environment of claim 14 further comprising storing the expected stimulus signal within an expected stimulus signal storage device.

23 . The method for simulating a functional operational environment of claim 22 , wherein storing comprises storing the expected stimulus signal within at least one of: a) FIFO memory;

or b) random access memory.

24 . The method for simulating a functional operational environment of claim 14 further comprising:

receiving a response signal from the first type SOC device-under-test;

ascertaining whether the response signal is a deterministic response signal; and

passing deterministic response signals for comparison with expected responses to determine whether the first type SOC device-under-test is functioning correctly.

25 . A method for testing in a reconfigurable tester, the method comprising:

simulating a functional operational environment for a first type device-under-test with a tester, comprising configuring the tester to recognize and respond to a non-deterministic response signal from the first type device-under-test; and

simulating a functional operational environment for a second type device-under-test with the tester, comprising configuring the tester to recognize and respond to a non-deterministic response signal from the second type device-under-test after testing the first type device-under-test.