IP Library Patent Application 11935998
Patent Application
App. No. 11/935,998

CONTROLLED AND SELECTIVE FORMATION OF CATALYST NANAOPARTICLES

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Quick Facts
Patent No.
US None
App. No.
11/935,998
Abstract

A method for forming catalyst nanoparticles on a substrate and a method for forming elongate nanostructures on a substrate using the nanoparticles as a catalyst are provided. The methods may advantageously be used in, for example, semiconductor processing. The methods are scalable and fully compatible with existing semiconductor processing technology. Furthermore, the methods allow forming catalyst particles and elongate nanostructures at predetermined locations on a substrate.

Claims (51)

1 . A method for forming catalyst nanoparticles on a substrate, the method comprising:

forming recesses in the substrate at predetermined locations, wherein each recess has a bottom;

providing catalyst nanoparticles on the substrate; and

selectively removing from the substrate catalyst nanoparticles present at locations other than at the bottom of the recesses.

2 . The method according to claim 1 , wherein providing catalyst nanoparticles on the substrate is performed by:

providing at least one layer of catalyst material on the substrate, such that the catalyst material covers at least the bottom of the recesses; and

breaking up the layer of catalyst material into catalyst nanoparticles.

3 . The method according to claim 2 , wherein breaking up the layer of catalyst material is performed by at least one of a thermal assisted method and a plasma assisted method.

4 . The method according to claim 1 , wherein providing catalyst nanoparticles on the substrate is performed by:

depositing catalytic nanoparticles onto the substrate from a solution comprising the catalyst nanoparticles and a solvent; and

after deposition of the catalyst nanoparticles on the substrate, removing the solvent.

5 . The method according to claim 4 , wherein removing the solvent is performed by evaporation.

6 . The method according to claim 1 , wherein selectively removing from the substrate catalyst nanoparticles present at locations other than at the bottom of the recesses is performed by:

depositing a sacrificial material onto the substrate such that the sacrificial material covers at least the catalyst nanoparticles present at the bottom of the recesses;

removing the catalyst nanoparticles present at locations other than at the bottom of the recesses; and

removing the sacrificial material.

7 . The method according to claim 6 , wherein removing the sacrificial material is performed by a wet cleaning process.

8 . The method according to claim 7 , further comprising removing impurities from edges of the recesses.

9 . The method according to claim 8 , wherein removing impurities from edges of the recesses is performed by immersing the substrate in a 1:4 H 2 SO 4 :H 2 O 2 solution for about five minutes.

10 . The method according to claim 1 , wherein forming recesses in the substrate at predetermined locations is performed by etching recesses in the substrate at the predetermined locations.

11 . The method according to claim 10 , further comprising, before etching, lithographically defining the predetermined locations on the substrate.

12 . The method according to claim 1 , wherein the substrate comprises a base substrate, and wherein forming recesses in the substrate at predetermined locations is performed by forming recesses in the base substrate.

13 . The method according to claim 1 , wherein the substrate comprises a base substrate and a dielectric layer, and wherein forming recesses in the substrate at predetermined locations is performed by forming recesses in the dielectric layer.

14 . Use of the method according to claim 1 in a growth process of elongate nanostructures on a substrate.

15 . A method for forming elongate nanostructures on a substrate, the method comprising:

forming recesses in a substrate at predetermined locations, wherein each recess has a bottom;

providing catalyst nanoparticles on the substrate;

selectively removing from the substrate catalyst nanoparticles present at locations other than at the bottom of the recesses; and

growing elongate nanostructures in the recesses using the catalytic nanoparticles provided at the bottom of the recesses as a catalyst.

16 . The method according to claim 15 , wherein providing catalytic nanoparticles on the substrate is performed by:

providing at least one layer of catalyst material on the substrate, such that the catalyst material covers at least the bottom of the recesses; and

breaking up the layer of catalyst material into catalyst nanoparticles.

17 . The method according to claim 16 , wherein breaking up the layer of catalyst material is performed by at least one of a thermal assisted method and a plasma assisted method.

18 . The method according to claim 15 , wherein providing catalyst nanoparticles on the substrate is performed by:

depositing catalytic nanoparticles onto the substrate from a solution comprising the catalyst nanoparticles and a solvent; and

after deposition of the catalyst nanoparticles on the substrate, removing the solvent.

19 . The method according to claim 18 , wherein removing the solvent is performed by evaporation.

20 . The method according to claim 15 , wherein growing elongate nanostructures is performed by a chemical vapor deposition process.

21 . The method according to claim 20 , wherein growing elongate nanostructures comprises:

providing a carbon source and an assistant gas; and

growing elongate nanostructures by heating the substrate.

22 . The method according to claim 21 , wherein growing elongate nanostructures is performed by heating the substrate to a temperature of from about 600° C. to about 800° C.

23 . The method according to claim 15 , wherein selectively removing from the substrate catalyst nanoparticles present at locations other than at the bottom of the recesses is performed by:

depositing a sacrificial material onto the substrate such that the sacrificial material covers at least the catalyst nanoparticles present at the bottom of the recesses;

removing the catalyst nanoparticles present at locations other than at the bottom of the recesses; and

removing the sacrificial material.

24 . The method according to claim 15 , wherein the substrate comprises a base substrate, and wherein forming recesses in the substrate at predetermined locations is performed by forming recesses in the base substrate.

25 . The method according to claim 15 , wherein the substrate comprises a base substrate and a dielectric layer, and wherein forming recesses in the substrate at predetermined locations is performed by forming recesses in the dielectric layer.

26 . The method according to claim 15 , wherein growing elongate nanostructures is performed by base growth.

27 . The method according to claim 15 , wherein growing elongate nanostructures is performed by tip growth.

28 . Use of the method according to claim 15 in semiconductor processing.

Assignments (2)
"IMEC" IS AN ALTERNATIVE OFFICIAL NAME FOR "INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW" Recorded Apr 7, 2010
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW
To: IMEC
Reel/Frame 024200/0675 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2008
From: ESCONJAUREGUI, SANTIAGO CRUZ; WHELAN, CAROLINE
To: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM (IMEC)
Reel/Frame 020504/0704 →