On-chip circuit for transition delay fault test pattern generation with launch off shift
View Patent ↗A clock pulse controller includes a test clock pulse input for receiving test clock pulses. A scan enable input receives a scan enable signal having a first state and a second state. A trigger pulse input receives a trigger pulse. A clock pulse output generates a launch clock pulse and a capture clock pulse from the test clock pulses immediately after receiving a predetermined number of the test clock pulses immediately following the trigger pulse. A delayed scan enable output generates a delayed scan enable signal that transitions from the first state to the second state between a leading edge of the launch clock pulse and a leading edge of the capture clock pulse.
1. A clock pulse controller comprising:
a test clock pulse input for receiving test clock pulses;
a scan enable input for receiving a scan enable signal having a first state and a second state;
a trigger pulse input for receiving a trigger pulse;
a clock pulse output for generating a launch clock pulse and a capture clock pulse from the test clock pulses immediately after receiving a predetermined number of the test clock pulses immediately following the trigger pulse; and
a delayed scan enable output for generating a delayed scan enable signal that transitions from the first state to the second state between a leading edge of the launch clock pulse and a leading edge of the capture clock pulse.
2. The clock pulse controller of claim 1 further comprising a scan clock pulse input for receiving scan clock pulses, the clock pulse output generating the scan clock pulses when the delayed scan enable signal transitions from the second state to the first state.
3. The clock pulse controller of claim 2 further comprising the delayed scan enable output that transitions from the second state to the first state when the scan enable signal transitions from the second state to the first state.
4. The clock pulse controller of claim 1 further comprising a counter for predetermining the number of the test clock pulses.
5. A clock pulse controller comprising:
means for receiving test clock pulses;
means for receiving a scan enable signal having a first state and a second state;
means for receiving a trigger pulse;
means for generating a launch clock pulse and a capture clock pulse immediately after receiving a predetermined number of the test clock pulses immediately following the trigger pulse; and
means for generating a delayed scan enable signal so that the delayed scan enable signal transitions from the first state to the second state between a leading edge of the launch clock pulse and a leading edge of the capture clock pulse.
6. The clock pulse controller of claim 5 further comprising means for receiving scan clock pulses and means for generating the scan clock pulses in response to a transition of the scan enable signal from the second state to the first state.
7. The clock pulse controller of claim 6 further comprising means for generating the delayed scan enable signal so that the delayed scan enable signal transitions from the second state to the first state when the scan enable signal transitions from the second state to the first state.
8. The clock pulse controller of claim 5 further comprising means for predetermining the number of the consecutive clock pulses.
9. A method of generating clock pulses for an integrated circuit comprising steps of:
receiving test clock pulses;
receiving a scan enable signal having a first state and a second state;
receiving a trigger pulse;
generating a launch clock pulse and a capture clock pulse from the test clock pulses immediately after receiving a predetermined number of test clock pulses immediately following the trigger pulse; and
generating a delayed scan enable signal that transitions from the first state to the second state between a leading edge of the launch clock pulse and a leading edge of the capture clock pulse.
10. The method of claim 9 further comprising steps of receiving scan clock pulses and generating the scan clock pulses after the scan enable signal transitions from the second state to the first state.
11. The method of claim 10 further comprising a step of generating the delayed scan enable signal so that the delayed scan enable signal transitions from the second state to the first state when the scan enable signal transitions from the second state to the first state.
12. The method of claim 11 further comprising a step of predetermining the number of the test clock pulses.