Microscope calibration apparatus and method and stage including calibration apparatus
View Patent ↗A stage for supporting a specimen slide and for calibrating a microscope includes a base and a calibration component integral with the base. The calibration component includes at least one calibration element for positional calibration and at least one calibration element for optical calibration. Calibration of the microscope can be performed without the need for independent calibration slides. The calibration component may be a glass calibration component or may be defined by a calibration element formed or etched through the base.
1. A stage for supporting a specimen slide, comprising:
a base having a bottom surface and a top surface, the top surface being configured for supporting the specimen slide; and
a calibration component integral with the base such that the calibration component is attached directly to or defined by the base and not removable from the base, the calibration component including a first calibration element configured for performing positional calibration of a microscope and a second calibration element configured for performing optical calibration of the microscope, the first and second calibration elements being configured for performing respective positional and optical calibrations without use of an independent calibration device that is moveable relative to or separable from the base.
2. The stage of claim 1 , the base defining a cavity, wherein the calibration component is positioned within the cavity and attached to an interior portion of the base.
3. The stage of claim 1 , wherein a portion of the calibration component is glass.
4. The stage of claim 1 , wherein the calibration component includes at least one calibration element that is defined by the base by being formed or etched through the base.
5. The stage of claim 1 , the first calibration element defining a first field of view that includes a fiducial mark, and the second calibration element defining a second field of view that is clear and different than the first field of view.
6. The stage of claim 5 , the calibration component comprising:
a central calibration element defining a central field of view, and
a plurality of calibration elements defining respective fields of view arranged around the central field of view.
7. The stage of claim 6 , wherein the central field of view is clear, the central calibration element being configured for performing optical calibration, and wherein at least one other calibration element defines a field of view that includes a fiducial mark, the at least one other calibration element being configured for performing positional calibration.
8. The stage of claim 1 , wherein the second calibration element is configured for performing optical calibration based on an intensity of light, a uniformity of light or a modular transfer function.
9. A stage for supporting a specimen slide, comprising:
a base having a bottom surface and a top surface, the base being configured for supporting a single slide on the top surface; and
a calibration component integral with the base such that the calibration component is attached directly to or defined by the base and not removable from the base, the calibration component including a first calibration element defining a first discrete field of view and being configured for performing positional calibration and a second calibration element defining a second discrete field of view different than the first discrete field of view and being configured for performing optical calibration, the first and second calibration elements being configured for performing respective positional and optical calibrations without use of an independent calibration device that is moveable relative to or separable from the base.
10. The stage of claim 9 , wherein the calibration component includes at least one calibration element that is defined by the base by being formed or etched through the base.
11. The stage of claim 9 , wherein the first field of view includes a fiducial mark, and the second field of view is clear.
12. The stage of claim 9 , the calibration component comprising:
a central calibration element defining a central field of view, and
a plurality of calibration elements defining respective fields of view arranged around the central field of view.
13. The stage of claim 12 , wherein the central field of view is clear, the central calibration element being configured for performing optical calibration, and wherein at least one other calibration element defines a field of view that includes a fiducial mark, the at least one other calibration element being configured for performing positional calibration.
14. The stage of claim 13 , wherein the second calibration element is configured for performing optical calibration based on an intensity of light, a uniformity of light, a magnification, or a modular transfer function.
15. A method of calibrating a microscope, comprising:
determining positional calibration information using a calibration component integral with a stage of the microscope such that the calibration component is attached directly to or defined by the base and not removable from the base;
determining optical calibration information using the calibration component; and
calibrating the microscope based on the positional calibration information and the optical calibration information determined using the calibration component, wherein positional calibration and optical calibration are performed without use of an independent calibration device that is moveable relative to or separable from the base.
16. The method of claim 15 , wherein positional calibration information is determined from an element of the calibration component that defines a field of view including a fiducial mark.
17. The method of claim 15 , wherein optical calibration information is determined from an element of the calibration component that defines a clear field of view.
18. An apparatus for performing positional and optical calibration of a microscope, comprising:
a calibration component integral with a stage of the microscope such that the calibration component is attached directly to or defined by the stage and not removable from the stage, the calibration component including a first calibration element configured for performing positional calibration of the microscope and a second calibration element configured for performing optical calibration of the microscope without use of an independent calibration device that is moveable relative to or separable from the base.
19. The apparatus of claim 18 , wherein the calibration component includes at least one calibration element that is defined by the base by being formed or etched through the stage.
20. The apparatus of claim 18 , wherein the first calibration element defines a first field of view including a fiducial mark, and the second calibration element defines a second field of view that is clear.
21. The stage of claim 18 , the calibration component comprising:
a central calibration element defining a central field of view, and
a plurality of calibration elements defining respective fields of view arranged around the central field of view.
22. The stage of claim 21 , wherein the central field of view is clear, the central calibration element being configured for performing optical calibration, and wherein at least one other calibration element defining a field of view that includes a fiducial mark, the at least one other calibration element being configured for performing positional calibration.