IP Library Granted Patent US 7,711,499
Granted Patent B2
US 7,711,499 · App. 11/954,043 · Granted May 4, 2010

Eddy current data interpolation/extrapolation

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Quick Facts
Patent No.
US 7,711,499
App. No.
11/954,043
Granted
May 4, 2010
Kind
B2
Abstract

A method of synthesizing nondestructive examination data of a component that combines data sets acquired at least two different frequencies. At least one of the data sets is interpolated or extrapolated to the equivalent of data acquired at one of the other frequencies employing a third, reference set of eddy current inspection data that is acquired at each of the inspection frequencies being combined.

Claims (18)

1. A method of interpolating or extrapolating eddy current inspection data at a desired frequency, comprising the steps of:

acquiring a first set of eddy current inspection data as a result of a first scan by a first eddy current probe operated at a first frequency;

acquiring a second set of eddy current inspection data as a result of a second scan by a second eddy current probe operated at a second frequency;

acquiring a reference set of eddy current inspection data from a third scan of a reference probe operated at the first frequency, the second frequency and the desired frequency; and

inferring the eddy current inspection data at the desired frequency based upon the first set, the second set and the reference set of eddy current inspection data.

2. The method of claim 1 wherein the desired frequency is either the first frequency or the second frequency.

3. The method of claim 1 wherein the steps of acquiring the first set of eddy current inspection data, acquiring the second set of eddy current inspection data and acquiring the reference set of eddy current inspection data are acquired with the same type of probe and under substantially similar inspection conditions.

4. The method of claim 1 including the step of rotating and scaling either the first set of eddy current inspection data or the second set of eddy current so that the only difference from a comparison perspective between the first set of eddy current inspection data and the second set of eddy current inspection data is the first frequency that the first probe was operated at and the second frequency that the second probe was operated at.

5. The method of claim 4 including the step of rotating and scaling the reference set of eddy current inspection data to match a scale and orientation of the first set of eddy current inspection data and the second set of eddy current inspection data.

6. The method of claim 1 wherein the reference set of eddy current inspection data includes a number of responses to different discontinuities and structures.

7. The method of claim 6 including the step of obtaining the reference set of eddy current inspection data from an eddy current probe scan of a calibration tube.

8. The method of claim 1 wherein at least one of either the first set of eddy current inspection data, the second set of eddy current inspection data or the reference set of eddy current inspection data is acquired using a mathematical model.

9. The method of claim 1 wherein the desired frequency is the second frequency and the inferring step converts the first set of eddy current inspection data to the second frequency using the formula:

C *( A )=( B )

Where A is the first set of eddy current inspection data and B is the second set of eddy current inspection data and C is a calculated matrix of coefficients.

10. The method of claim 9 wherein C is constructed from a subset of the reference set of eddy current inspection data.

11. The method of claim 10 wherein once matrix C is calculated it can be utilized to interpolate inspection frequencies for any data set that has been obtained in a fashion similar to the reference set of eddy current inspection data.

12. The method of claim 11 wherein the matrix C can be used to interpolate inspection data for different tubing diameters.

Assignments (9)
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jan 30, 2024
From: CREDIT SUISSE AG, CAYMAN ISLANDS, AS COLLATERAL AGENT
To: WESTINGHOUSE ELECTRIC COMPANY LLC; FAUSKE AND ASSOCIATES LLC
Reel/Frame 066380/0392 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jan 30, 2024
From: BANK OF MONTREAL, AS COLLATERAL AGENT
To: WESTINGHOUSE ELECTRIC COMPANY LLC; BHI ENERGY I SPECIALTY SERVICES LLC
Reel/Frame 066380/0599 →
SECURITY INTEREST Recorded Jan 26, 2024
From: WESTINGHOUSE ELECTRIC COMPANY LLC; BHI ENERGY I SPECIALTY SERVICES LLC; STONE & WEBSTER, L.L.C. (FORMERLY STONE & WEBSTER, INC.)
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 066373/0604 →
PATENT SECURITY AGREEMENT Recorded May 27, 2022
From: WESTINGHOUSE ELECTRIC COMPANY LLC; BHI ENERGY I SPECIALTY SERVICES LLC
To: BANK OF MONTREAL, AS COLLATERAL AGENT
Reel/Frame 060791/0372 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 1, 2019
From: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
To: WESTINGHOUSE ELECTRIC COMPANY LLC; FAUSKE AND ASSOCIATES LLC
Reel/Frame 049937/0032 →
SECURITY INTEREST Recorded Aug 1, 2018
From: WESTINGHOUSE ELECTRIC COMPANY LLC; FAUSKE AND ASSOCIATES LLC
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
Reel/Frame 046708/0222 →
SECURITY INTEREST Recorded Aug 1, 2018
From: WESTINGHOUSE ELECTRIC COMPANY LLC; FAUSKE AND ASSOCIATES LLC
To: GOLDMAN SACHS BANK USA, AS COLLATERAL AGENT
Reel/Frame 046708/0332 →
SECURITY INTEREST Recorded Aug 1, 2018
From: WESTINGHOUSE ELECTRIC COMPANY LLC; FAUSKE AND ASSOCIATES LLC
To: BANK OF MONTREAL, AS ADMINISTRATIVE AGENT
Reel/Frame 046708/0639 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2007
From: JUNKER, WARREN R., MR.; NENNO, THOMAS W., MR.; YAKLICH, DANIEL J., MR.; POCRATSKY, RONALD J., MR.
To: WESTINGHOUSE ELECTRIC COMPANY LLC
Reel/Frame 020247/0952 →