Sensor module and method for manufacturing a sensor module
View Patent ↗A method of manufacturing a sensor module includes providing a substrate comprising an array of magnetically sensitive elements on a first main face of the substrate. An array of conducting lines is applied over the first main face of the substrate. An array of electrical interconnects is applied over the first main face of the substrate. The substrate is singulated after application of the electrical interconnects.
1. A sensor module comprising:
a semiconductor die comprising a magnetically sensitive element;
a plurality of electrical interconnect elements;
a redistribution layer electrically coupling the plurality of electrical interconnect elements, the magnetically sensitive element, and a conducting coil; and
a mold layer encapsulating the semiconductor die.
2. The sensor module of claim 1 , wherein the semiconductor die comprises a silicon die.
3. The sensor module of claim 1 , wherein the magnetically sensitive element comprises a giant magneto resistance (GMR) element.
4. The sensor module of claim 1 , wherein the magnetically sensitive element comprises a Hall element.
5. The sensor module of claim 1 , wherein the redistribution layer comprises a first polymer layer applied on the semiconductor die; and
wherein the conducting coil is applied over the first polymer layer.
6. The sensor module of claim 5 , wherein the redistribution layer comprises a second polymer layer applied over the conducting coil.
7. The sensor module of claim 1 , wherein the conducting coil is configured to generate a magnetic field for testing the magnetically sensitive element.
8. The sensor module of claim 1 , wherein the redistribution layer comprises a plurality of insulation layers and at least one metal layer.
9. The sensor module of claim 1 , wherein at least one of the plurality of electrical interconnect elements is not aligned with the semiconductor die in a direction perpendicular to the semiconductor die.
10. The sensor module of claim 1 , wherein each of the plurality of electrical interconnect elements comprises a solder ball.
11. The sensor module of claim 1 , wherein the redistribution layer is between the semiconductor die and the plurality of electrical interconnect elements,
wherein the plurality of electrical interconnect elements are electrically coupled to the magnetically sensitive element via die pads of the semiconductor die,
wherein the conducting coil is electrically coupled between at least two of the plurality of electrical interconnect elements, and
wherein the mold layer directly contacts the redistribution layer.
12. A sensor module, comprising:
a first semiconductor die comprising a magnetically sensitive element;
a second semiconductor die;
a plurality of electrical interconnect elements;
a redistribution layer electrically coupling the first semiconductor die to the second semiconductor die and electrically coupling the magnetically sensitive element, the plurality of electrical interconnect elements, and a conductor coil; and
a mold layer encapsulating the first and second semiconductor dies.
13. The sensor module of claim 12 , wherein each of the plurality of electrical interconnect elements comprises a solder ball.
14. The sensor module of claim 12 , wherein at least one of the plurality of electrical interconnect elements is not aligned with either of the first and second semiconductor dies in a direction perpendicular to the first and second semiconductor dies.
15. The sensor module of claim 12 , wherein each of the plurality of electrical interconnect elements comprises a solder ball.
16. A sensor module comprising:
a semiconductor die comprising a magnetically sensitive element;
a plurality of electrical interconnect elements;
a laminate electrically coupling the plurality of electrical interconnect elements, the magnetically sensitive element, and a conducting coil; and
a mold layer encapsulating the semiconductor die.
17. The sensor module of claim 16 , wherein the magnetically sensitive element comprises a giant magneto resistance (GMR) element.
18. The sensor module of claim 16 , wherein the magnetically sensitive element comprises a Hall element.
19. The sensor module of claim 16 , wherein at least one of the plurality of electrical interconnect elements is not aligned with the semiconductor die in a direction perpendicular to the semiconductor die.
20. The sensor module of claim 16 , wherein each of the plurality of electrical interconnect elements comprises a solder ball.