Spectral photoelectric measurement transformer
View Patent ↗A spectral photoelectric measurement transformer comprises an array ( 10 ) of photoelectric transformer elements and dielectric interference bandpass filters ( 22 a, 22 b ) disposed on a common filter support ( 21 ) connected upstream of them for sensitizing the transformer elements to different wavelength ranges of the measurement light. The bandpass filters are divided into a number of filter groups, each of which contains the same different bandpass filters within the filter group. An optical deflector element ( 30 ) spectrally shifts the effective bandpass curves of the bandpass filters of all the filter groups except one so that the effective bandpass curves of all the bandpass filters have different spectral positions. As a result, a multiplication of the filter channels effectively made available can be achieved using only a few different bandpass filters. Due to the small number of different bandpass filters, the measurement transformer is inexpensive to manufacture.
1. Spectral photoelectric measurement transformer, comprising:
a) an array of photoelectric transformer elements;
b) a plurality of dielectric interference bandpass filters disposed on a common filter support and connected upstream from the array of photoelectric transformer elements and sensitizing the transformer elements to different wavelength ranges of the measurement light,
wherein the plurality of bandpass filters are divided into a plurality of identical filter groups, each identical filter group including an identical plurality of different bandpass filters; and
c) an optical deflector element connected upstream of the bandpass filters, the optical deflector element having a number of portions corresponding to the number of filter groups,
wherein each portion of the deflector element corresponds to a different filter group,
wherein each portion of the deflector element deflects a distinct beam of measurement light at an angle of deflection different than any other beam of measurement light for any other portion of the deflector element, such that (i) said distinct beam of measurement light is applied to the filter group corresponding to said portion of the deflector element at an angle of incidence corresponding to said angle of deflection, and (ii) the effective bandpass curves of the bandpass filters of at least all but one of the filter groups is shifted so that the effective bandpass curves of all the bandpass filters have different spectral positions,
wherein the half-widths and spectral distances of the bandpass curves of the bandpass filters of each filter group are disposed so that transmission gaps are left free between the bandpass curves, and
wherein the widths of the transmission gaps essentially correspond to a multiple of the sought spectral resolution corresponding to the number of filter groups.
2. Spectral photoelectric measurement transformer according to claim 1 , wherein the angles of deflection of the deflector element are selected so that the effective bandpass curves of the band pass filters of at least all but one of the filter groups are shifted essentially equidistantly into the transmission gaps.
3. Spectral photoelectric measurement transformer according to claim 1 , wherein the optical deflector element is disposed directly on or at a short distance from the filter support.
4. Spectral photoelectric measurement transformer according to claim 1 , wherein the optical deflector element has a plane parallel portion and at least one prismatic portion or an appropriate prismatic Fresnel structure.
5. Spectral photoelectric measurement transformer according to claim 4 , wherein the optical deflector element has two prismatic portions which deflect the measurement light by the same angle in two spatial directions orthogonal to one another.
6. Spectral photoelectric measurement transformer according to claim 1 , wherein the optical deflector element is made from optical transparent plastic.
7. Spectral photoelectric measurement transformer according to claim 1 , wherein the dielectric interference bandpass filters are lithographically applied to the filter support using thin film coating technology.
8. Spectral photoelectric measurement transformer, comprising:
a) an array of photoelectric transformer elements;
b) a plurality of dielectric interference bandpass filters disposed on a common filter support and connected upstream from the array of photoelectric transformer elements and sensitizing the transformer elements to different wavelength ranges of the measurement light,
wherein the plurality of bandpass filters are divided into a plurality of identical filter groups, each identical filter group including an identical plurality of different bandpass filters; and
c) an optical deflector element connected upstream of the bandpass filters, the optical deflector element having a number of portions corresponding to the number of filter groups,
wherein each portion of the deflector element corresponds to a different filter group, and
wherein each portion of the deflector element deflects a distinct beam of measurement light at an angle of deflection different than any other beam of measurement light for any other portion of the deflector element, such that (i) said distinct beam of measurement light is applied to the filter group corresponding to said portion of the deflector element at an angle of incidence corresponding to said angle of deflection, and (ii) the effective bandpass curves of the bandpass filters of at least all but one of the filter groups is shifted so that the effective bandpass curves of all the bandpass filters have different spectral positions.
9. Spectral photoelectric measurement transformer, comprising:
a) an array of photoelectric transformer elements;
b) a plurality dielectric interference bandpass filters disposed on a common filter support and connected upstream from the array of photoelectric transformer elements and sensitizing the transformer elements to different wavelength ranges of the measurement light;
wherein the plurality of bandpass filters includes a plurality of filter groups of one or more bandpass filters each; and
c) an optical deflector element connected upstream of the bandpass filters, the optical deflector element having a number of portions corresponding to the number of filter groups,
wherein each portion of the deflector element corresponds to a different filter group, and
wherein each portion of the deflector element deflects a distinct beam of measurement light at an angle of deflection different than any other beam of measurement light for any other portion of the deflector element, such that (i) said distinct beam of measurement light is applied to the filter group corresponding to said portion of the deflector element at an angle of incidence corresponding to said angle of deflection, and (ii) the effective bandpass curves of the bandpass filters of at least all but one of the filter groups is shifted so that the effective bandpass curves of all the bandpass filters have different spectral positions.
10. Spectral photoelectric measurement transformer, comprising:
a) an array of photoelectric transformer elements;
b) a plurality of dielectric interference bandpass filters disposed on a common filter support and connected upstream from the array of photoelectric transformer elements and sensitizing the transformer elements to different wavelength ranges of the measurement light,
wherein the plurality of bandpass filters are divided into a plurality of identical filter groups, each identical filter group including an identical plurality of different bandpass filters; and
c) an optical deflector element connected upstream of the bandpass filters, whereby, the effective bandpass curves of the bandpass filters of at least all but one of the filter groups is shifted so that the effective bandpass curves of all the bandpass filters have different spectral positions,
said optical deflector element having a number of portions corresponding to the number of filter groups,
wherein each portion of the deflector element corresponds to a different filter group, and
wherein the optical deflector element has a plane parallel portion and at least one prismatic portion or an appropriate prismatic Fresnel structure.