IP Library Granted Patent US 7,849,754
Granted Patent B2
US 7,849,754 · App. 11/964,100 · Granted Dec 14, 2010

Method and system for sampling syngas

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Quick Facts
Patent No.
US 7,849,754
App. No.
11/964,100
Granted
Dec 14, 2010
Kind
B2
Abstract

A method is provided for sampling hot gas. The method includes inserting a probe into a flow of hot gas, and collecting a sample of the hot gas with the probe. The sample of the hot gas is quenched prior to an analysis of the sample.

Claims (28)

1. A method for sampling hot gas, said method comprising:

inserting a probe into a flow of hot gas, wherein the probe includes a plurality of injection channels, the probe further includes a collection channel positioned downstream from the plurality of injection channels and a cooling channel positioned adjacent to and in flow communication with the collection channel;

collecting a sample of the hot gas with the probe; and

quenching the sample of the hot gas prior to an analysis of the sample.

2. A method in accordance with claim 1 , further comprising separating particles from the quenched sample.

3. A method in accordance with claim 1 , further comprising analyzing the quenched sample under inert conditions.

4. A method in accordance with claim 1 , wherein said quenching the sample further comprises quenching the sample with a flow of nitrogen.

5. A method in accordance with claim 1 , further comprising analyzing the quenched sample using a spectrometer.

6. A method in accordance with claim 1 , further comprising filtering the quenched sample.

7. A method in accordance with claim 1 , inserting a probe into a flow of hot gas further comprises inserting a probe into a flow of hot syngas channeled through a gasifier.

8. A system for sampling hot gas, said system comprising:

a probe configured to be inserted into a flow of hot gas for collecting a sample of the hot gas, wherein said probe includes a plurality of injection channels, said probe further includes a collection channel positioned downstream from said plurality of injection channels and a cooling channel positioned adjacent to and in flow communication with said collection channel; and

a fluid source configured to channel cooling fluid for quenching the sample prior to an analysis of the sample.

9. A system in accordance with claim 8 , further comprising a gas separator configured to separate particles from the quenched sample.

10. A system in accordance with claim 8 , wherein the cooling fluid comprises nitrogen.

11. A system in accordance with claim 8 , further comprising a spectrometer used to analyze the quenched sample.

12. A system in accordance with claim 11 , wherein the spectrometer analyzes the sample under inert conditions.

13. A system in accordance with claim 8 , further comprising at least one filter used to filter the quenched sample.

14. A system in accordance with claim 8 , wherein said probe is configured to analyze at least one of a gas emissivity and an absorption coefficient of the hot gas.

15. A probe configured to be inserted into a flow of hot syngas through a gasifier to facilitate sampling the hot syngas, said probe comprising a body comprising:

a plurality of injection channels;

a collection channel positioned downstream from said plurality of injection channels, said collection channel extending axially through the body and configured to collect a sample of the syngas; and

a cooling channel positioned radially outward from the collection channel and configured to channel cooling fluid to quench the sample prior to an analysis of the sample.

16. A probe in accordance with claim 15 , wherein said probe is configured to channel the quenched sample to a gas separator that separates particles from the quenched sample.

17. A probe in accordance with claim 15 , wherein said probe facilitates analyzing the quenched sample under inert conditions.

18. A probe in accordance with claim 15 , wherein the cooling fluid comprises nitrogen.

19. A probe in accordance with claim 15 , wherein said probe is configured to channel the quenched sample to a spectrometer used to analyze the quenched sample.

20. A probe in accordance with claim 15 , wherein said probe is configured to channel the quenched sample to at least one filter used to filter the quenched sample.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 22, 2019
From: GENERAL ELECTRIC COMPANY
To: AIR PRODUCTS AND CHEMICALS, INC.
Reel/Frame 050786/0768 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 26, 2007
From: ROUCIS, JOHN B.
To: GENERAL ELECTRIC COMPANY
Reel/Frame 020287/0340 →