IP Library Granted Patent US 7,529,433
Granted Patent B2
US 7,529,433 · App. 11/971,726 · Granted May 5, 2009

Humidity tolerant electro-optic device

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Quick Facts
Patent No.
US 7,529,433
App. No.
11/971,726
Granted
May 5, 2009
Kind
B2
Abstract

The invention relates to an electro-optic modulator structure containing an additional set of bias electrodes buried within the device for applying bias to set the operating point. Thus the RF electrodes used to modulate incoming optical signals can be operated with zero DC bias, reducing electrode corrosion by electro-migration and other effects that can be present in non-hermetic packages. The bias electrodes include an upper split portion and an optically transparent lower portion. The optically transparent lower layer improves modulation frequency and reduces optical loss.

Claims (32)

1. An electro-optic device comprising:

a substrate having an optical waveguide formed therein;

a bias electrode structure disposed for generating a low frequency or DC electric field in the optical waveguide, the bias electrode structure including a first bias electrode having an first portion and a second portion, the first portion including a strip disposed directly above and substantially aligned with a center of the optical waveguide, the first portion having a higher transparency than the second portion;

an RF electrode structure disposed for generating an RF electric field in the optical waveguide, the RF electrode structure including a first RF electrode; and

a buffer layer disposed between the first RF electrode and the first bias electrode.

2. An electro-optic device according to claim 1 , wherein the first portion comprises a first material, the second portion comprises a second material, and the first material has a higher resistivity than the second material.

3. An electro-optic device according to claim 1 , wherein the first portion comprises a first layer having a first thickness, the second portion comprises a second layer having a second thickness, and the first thickness is smaller than the second thickness.

4. An electro-optic device according to claim 1 , wherein the first portion comprises one of a tantalum silicon nitride layer and a titanium silicon nitride layer having a resistivity greater than about 10 6 ohm-cm (Ω-cm) @25° C.

5. An electro-optic device according to claim 1 , wherein the first portion comprises one of a tantalum silicon nitride layer and a titanium silicon nitride layer having a thickness less than about 150 Å.

6. An electro-optic device according to claim 1 , wherein the second portion further comprises a first elongated segment shifted laterally relative to the center of the optical waveguide, the first elongated segment disposed for contributing to the low frequency or DC electric field generated in the optical waveguide.

7. An electro-optic device according to claim 6 , wherein the second portion comprises a second elongated segment shifted laterally relative to the center of the optical waveguide, the first and second elongated segments disposed on opposite sides of the optical waveguide.

8. An electro-optic device according to claim 1 , wherein the first bias electrode and the first RF electrode are substantially aligned with the optical waveguide.

9. An electro-optic device according to claim 1 , wherein the first portion comprises one of an In 2 O 3 , SnO 2 , and ZnO layer having a thickness less than about 150 Å.

10. An electro-optic device according to claim 9 , wherein the second portion comprises one of a tantalum silicon nitride layer and a titanium silicon nitride layer having a resistivity between about 10 4 ohm-cm and about 10 6 ohm-cm.

11. An electro-optic device according to claim 4 , wherein the second portion comprises one of a tantalum silicon nitride layer and a titanium silicon nitride layer having a resistivity between about 10 4 ohm-cm and about 10 6 ohm-cm.

12. An electro-optic device according to claim 1 , wherein the second portion comprises one of a tantalum silicon nitride layer and a titanium silicon nitride layer having a resistivity between about 10 4 ohm-cm and about 10 6 ohm-cm.

13. An electro-optic device according to claim 1 , comprising a bleed layer disposed between the first RF electrode and the buffer layer.

14. An electro-optic device according to claim 13 , wherein the bleed layer comprises one of tantalum silicon nitride and titanium silicon nitride, and wherein the first RF electrode is deposited on the bleed layer in the absence of an adhesion layer.

15. An electro-optic device according to claim 1 , wherein the first bias electrode is DC isolated from the first RF electrode.

16. An electro-optic device according to claim 1 , wherein the first bias electrode comprises a first bias signal electrode having a first plurality of elongated segments.

17. An electro-optic device according to claim 16 , wherein each segment of the first plurality of elongated segments is coupled to a common bias electrode.

18. An electro-optic device according to claim 17 , wherein the common bias electrode is coupled to a high conductivity strip along its length.

19. An electro-optic device according to claim 16 , wherein the common bias electrode is coupled to the first plurality of elongated segments with a plurality of feed lines that extend through a second plurality of elongated segments of a second bias signal electrode.

20. An electro-optic device according to claim 16 , wherein the common bias electrode is coupled to the first plurality of elongated segments with a plurality of feed lines spaced in dependence upon a predetermined frequency response of the bias electrode structure.

21. An electro-optic device according to claim 1 , wherein the electro-optic substrate comprises one of Z-cut lithium niobate and Z-cut lithium tantalate.

22. An electro-optic device according to claim 1 , wherein the first bias electrode comprises at least one layer formed of a material having a resistivity that is higher than a resistivity of the first RF electrode and lower than a resistivity of the substrate.

23. A method of fabricating an electro-optic device comprising:

providing a substrate having an optical waveguide formed therein;

forming a first bias electrode layer on the substrate, the first bias electrode layer patterned to provide a strip disposed directly above and substantially aligned with a center of the optical waveguide;

forming a second bias electrode layer on at least one of the first bias electrode layer and the substrate, the second bias electrode layer patterned to include at least one strip shifted laterally relative to the center of the optical waveguide, the first bias electrode layer having a higher optical transparency than the second bias electrode layer;

forming a buffer layer on the first and second bias electrode layers; and

forming an RF electrode layer on the buffer layer, the RF electrode layer patterned to include a first RF electrode.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2025
From: LUMENTUM OPERATIONS LLC
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 074974/0001 →
RELEASE OF SECURITY INTEREST Recorded Dec 13, 2019
From: DEUTSCHE AG NEW YORK BRANCH
To: OCLARO FIBER OPTICS, INC.; LUMENTUM OPERATIONS LLC; OCLARO, INC.
Reel/Frame 051287/0556 →
PATENT SECURITY AGREEMENT Recorded Dec 11, 2018
From: LUMENTUM OPERATIONS LLC; OCLARO FIBER OPTICS, INC.; OCLARO, INC.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047788/0511 →
CORRECTIVE ASSIGNMENT TO CORRECT PATENTS 7,868,247 AND 6,476,312 LISTED ON PAGE A-A33 PREVIOUSLY RECORDED ON REEL 036420 FRAME 0340. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 28, 2016
From: JDS UNIPHASE CORPORATION
To: LUMENTUM OPERATIONS LLC
Reel/Frame 037627/0641 →
CORRECTIVE ASSIGNMENT TO CORRECT INCORRECT PATENTS 7,868,247 AND 6,476,312 ON PAGE A-A33 PREVIOUSLY RECORDED ON REEL 036420 FRAME 0340. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 19, 2016
From: JDS UNIPHASE CORPORATION
To: LUMENTUM OPERATIONS LLC
Reel/Frame 037562/0513 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2015
From: JDS UNIPHASE CORPORATION
To: LUMENTUM OPERATIONS LLC
Reel/Frame 036420/0340 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 2, 2008
From: ADLER, JOHN; SUMANAWEERA, THILAKA; MAGUIRE, PATRICK
To: CYBERHEART, INC.
Reel/Frame 020747/0084 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 9, 2008
From: KISSA, KARL; MINFORD, WILLIAM J.; XU, JASON JIAZHAN; DRAKE, GLEN
To: JDS UNIPHASE CORPORATION
Reel/Frame 020344/0001 →