IP Library Granted Patent US 7,889,189
Granted Patent B2
US 7,889,189 · App. 11/979,520 · Granted Feb 15, 2011

Electrooptic device

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Quick Facts
Patent No.
US 7,889,189
App. No.
11/979,520
Granted
Feb 15, 2011
Kind
B2
Abstract

An electrooptic device includes: a plurality of parallel signal lines provided in a pixel array region in which a plurality of pixels is arrayed; a driving circuit electrically connected to a first end of each of the signal lines outside the pixel array region; and a protection circuit in which a diode device is electrically connected to a second end of the signal line, the diode device dissipating static electricity from the signal line. The resistance of the portion of the signal line from the center of the length to the driving circuit is higher than that of the portion of the signal line from the center to the diode device.

Claims (30)

1. An electrooptic device comprising:

a plurality of parallel signal lines provided in a pixel array region in which a plurality of pixels is arrayed;

a driving circuit electrically connected to a first end of each of the signal lines outside the pixel array region; and

a protection circuit in which a diode device is electrically connected to a second end of the signal line, the diode device dissipating static electricity from the signal line, wherein

the resistance of the portion of the signal line from the center of the length to the driving circuit is higher than that of the portion of the signal line from the center to the diode device, wherein the resistance of the portion of the signal line from the center of the length to the diode device is implemented by a first resistor device disposed at the portion of the signal line between the pixel array region and the diode device, the resistance of the portion of the signal line from the center to the driving circuit is implemented by a second resistor device disposed at the portion of the signal line between the pixel array region and the driving circuit, a first resistance of the first resistor device and a second resistance of the second resistor device set at predetermined resistances, and

when static electricity flows into the signal line, the static electricity flows preferentially to the diode device along the signal line and little static electricity flows to the driving circuit along the signal line

wherein the first resistor device and the second resistor device are formed by implanting one of low-concentration N-type impurities and low-concentration P-type impurities into a semiconductor film.

2. The electrooptic device according to claim 1 , wherein the pixel has a pixel-switching thin-film transistor and a pixel electrode;

the driving circuit has a complementary thin-film transistor; and

the signal line and the diode device are made of a plurality of thin films that constitute the pixel-switching thin-film transistor, the pixel electrode, and the complementary thin-film transistor.

3. The electrooptic device according to claim 1 , wherein the diode device is a PIN junction diode.

4. The electrooptic device according to claim 1 , wherein:

the diode device is an N-type or P-type diode; and

the driving circuit includes an N-type or P-type thin-film transistor.

5. An electrooptic device comprising:

a plurality of parallel signal lines provided in a pixel array region in which a plurality of pixels is arrayed;

a driving circuit electrically connected to a first end of each of the signal lines outside the pixel array region;

a protection circuit in which a diode device is electrically connected to a second end of the signal line, the diode device dissipating static electricity from the signal line;

a first resistor device disposed at the portion of the signal line between the pixel array region and the diode device; and

a second resistor device disposed at the portion of the signal line between the pixel array region and the driving circuit, a first resistance of the first resistor device and a second resistance of the second resistor device set at predetermined resistances, the second resistance arranged to be higher than the first resistance, wherein the first resistor device and the second resistor device are formed by implanting one of low-concentration N-type impurities and low-concentration P-type impurities into a semiconductor film.

6. The electrooptic device according to claim 5 , wherein the pixel has a pixel-switching thin-film transistor and a pixel electrode;

the driving circuit has a complementary thin-film transistor; and

the signal line, the diode device, the first resistor, and the second resistor are made of a plurality of thin films that constitute the pixel-switching thin-film transistor, the pixel electrode, and the complementary thin-film transistor.

7. An electrooptic device comprising:

a plurality of parallel signal lines provided in a pixel array region in which a plurality of pixels is arrayed;

a driving circuit electrically connected to a first end of each of the signal lines outside the pixel array region;

a first protection circuit in which a first diode device is electrically connected to a second end of the signal line, the first diode device dissipating static electricity from the signal line;

a second protection circuit in which a second diode device is electrically connected to the portion of the signal line between the pixel array region and the driving circuit at the first end of the signal line, the second diode device dissipating static electricity from the signal line;

a first resistor device disposed at the portion of the signal line between the pixel array region and the first diode device; and

a second resistor device disposed at the portion of the signal line between the pixel array region and the second diode device, a first resistance of the first resistor device and a second resistance of the second resistor device set at predetermined resistances, the second resistance arranged to be higher than the first resistance, wherein the first resistor device and the second resistor device are formed by implanting one of low-concentration N-type impurities and low-concentration P-type impurities into a semiconductor film.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2025
From: JAPAN DISPLAY INC.
To: MAGNOLIA WHITE CORPORATION
Reel/Frame 072398/0001 →
MERGER AND CHANGE OF NAME Recorded Jul 24, 2025
From: JAPAN DISPLAY EAST INC.; JAPAN DISPLAY WEST INC.
To: JAPAN DISPLAY INC.
Reel/Frame 071935/0063 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2013
From: SONY CORPORATION
To: JAPAN DISPLAY WEST INC.
Reel/Frame 031377/0942 →