Negative photosensitive polyimide polymer and uses thereof
The present invention relates to a negative photosensitive polyimide polymer having a repeating unit of formula (1) as a polymerized unit: wherein G, Q and P* are as defined in the specification. The polyimide polymer of the present invention is developable in an aqueous alkaline solution, and has the properties associated with an insulating layer and photoresist.
1. A negative photosensitive polyimide polymer having a repeating unit of formula (1) as a polymerized unit:
wherein G is a tetravalent organic group:
Q is selected from the group consisting of:
wherein each X independently is hydrogen, a halogen, a C 1 -C 4 alkyl or a C 1 -C 4 perfluoroalkyl, A is —O—, —S—, —CO—, —CH 2 —, —OC(O)— or —CONH—, m is an integer from 1 to 3, and n is 0 or 1;
P* is a photosensitive group of formula (2):
wherein R 1 is hydrogen or methyl, and R 2 is phenylene, or a linear or branched C 1 -C 8 alkylene, C 1 -C 8 alkenylene, C 1 -C 8 cycloalkylene, or C 1 -C 8 hydroxyalkylene.
2. The negative photosensitive polyimide polymer as claimed in claim 1 , wherein the tetravalent organic group is selected from the group consisting of:
wherein each Y independently is hydrogen, a halogen, a C 1 -C 4 perfluoroalkyl or C 1 -C 4 alkyl, and B is —CH 2 —, —O—, —S—, —CO—, —SO 2 —, —C(CH 3 ) 2 —, or —C(CF 3 ) 2 —.
3. The negative photosensitive polyimide polymer as claimed in claim 2 , wherein the tetravalent organic group is selected from the group consisting of:
4. The negative photosensitive polyimide polymer as claimed in claim 1 , wherein Q is selected from the group consisting of:
5. The negative photosensitive polyimide polymer as claimed in claim 4 , wherein Q is
6. The negative photosensitive polyimide polymer as claimed in claim 1 , wherein P* is
7. The negative photosensitive polyimide polymer as claimed in claim 1 , which is used in a lithography process as a photoresist.