Automatic microscope provided with an illumination field arranged in the aperture diaphragm plane of a condenser
View Patent ↗In an automatic microscope, there is the task to satisfy the demand for an economical, compact structure, especially a miniaturization as an essential aspect. The automatic microscope contains an optical system having the following: an illumination field ( 1 ) which is at least approximately arranged in the aperture diaphragm plane (ABE) of a condenser ( 2 ) and is used for the illumination of the object; an imaging optic ( 4 ); and, an image-providing sensor ( 5 ) arranged in the image plane of the imaging optic.
1. An automatic microscope for examining a specimen, the automatic microscope defining an optical axis and comprising:
an optical system including an illuminating field for illuminating the specimen;
said optical system further including a condenser mounted along said optical axis downstream of said illuminating field;
said condenser defining an aperture diaphragm plane;
said illuminating field being disposed at least approximately in said diaphragm plane;
said optical system further including an imaging optic mounted downstream of said condenser and defining an image plane;
an image-providing sensor mounted in said image plane;
an evaluation and control computer;
a light-source control unit for controlling at least one of the brightness and color temperature of said illuminating field;
said light-source control unit being connected to said evaluation and control computer;
said illuminating field comprising a plurality of individual semiconductor components emitting at respectively different wavelengths;
said light-source control unit functioning to drive said semiconductors individually or in groups of the same type thereby adjusting at least one of the brightness and color temperature of said illuminating field; and,
a microlens array for adapting said illumination field to the specimen to be illuminated.
2. The automatic microscope of claim 1 , said imaging optic having a field size and a magnification; and, said field size and said magnification being matched to said image-providing sensor to cause each image point to be resolved to be imaged via said imaging optic onto 2×2 sensor pixels of said image-providing sensor.
3. The automatic microscope of claim 1 , further comprising a monitor for image display and an evaluating electronic unit; and, said image-providing sensor being connected via said evaluating electronic unit to said monitor for said image display.
4. The automatic microscope of claim 1 , wherein said optical system defines an object plane and said specimen has a structure to be resolved and said image-providing sensor has an object-side aperture and said object-side aperture is determined by said structure of said specimen.
5. The automatic microscope of claim 1 , wherein said microlens array is disposed in the region of said aperture diaphragm plane.