Laser microscope and control method for the same

1. A laser microscope comprising:

a laser light source;

a scanning unit configured to scan a specimen with laser light emitted from the laser light source; and

an objective lens configured to focus the laser light scanned by the scanning unit on the specimen,

wherein the scanning unit is provided with an electro-optical deflecting element including an electro-optical crystal in which a refractive index gradient is induced in an injection direction of electric current by injecting the electric current, and

wherein the laser light is made incident between counter electrodes for injecting the electric current to the electro-optical crystal provided therebetween so that the laser light is deflected in the injection direction of the electric current, by the scanning unit.

2. A laser microscope according to claim 1 , wherein the electro-optical deflecting element has a Kerr constant equal to 5×10 −15 m 2 /V 2 or more.

3. A laser microscope according to claim 1 , wherein the electro-optical crystal [[is]] comprises KTa 1-x Nb x O 3 .

4. A laser microscope according to claim 1 , wherein the laser light is made incident on the electro-optical deflecting element, which has polarization dependency, so that a polarization direction of the laser light matches a predetermined direction that causes deflection of the laser light in accordance with the polarization dependency of the electro-optical deflecting element, by the electro-optical deflecting element.

5. A laser microscope according to claim 1 , wherein the laser light comprises one of light-stimulus laser light for the specimen and laser light for laser trapping.

6. A laser microscope according to claim 1 , wherein the laser light is used for observation of reflected light at the specimen.

7. A laser microscope according to claim 1 , wherein the laser light comprises ultrashort pulsed laser light producing a multiphoton-excitation effect in the specimen.

8. A laser microscope according to claim 7 , further comprising a control unit configured to switch a deflection direction of the laser light by the electro-optical deflecting element and to adjust an irradiation time of the laser light to a target irradiation position and an irradiation time of the laser light to outside of the target irradiation position.

9. A laser microscope according to claim 4 , wherein the scanning unit includes two of the electro-optical deflecting elements arranged in an optical-axis direction so that scanning directions thereof differ by 90°; and

wherein a polarization rotation unit configured to rotate the polarization direction of the laser light by 90° is provided between the electro-optical deflecting elements.

10. A laser microscope according to claim 9 , wherein the polarization rotation unit comprises an achromatic half-wave plate.

11. A laser microscope according to claim 9 , wherein the two electro-optical deflecting elements are disposed close to each other in the optical-axis direction.

12. A laser microscope according to claim 9 , wherein a conjugate position with respect to a pupil of the objective lens exists between the two electro-optical deflecting elements.

13. A laser microscope according to claim 9 , wherein relay lenses, which relay the pupil position of the objective lens to a deflection center position of the two electro-optical deflecting elements, are disposed between the two electro-optical deflecting elements.

14. A laser microscope according to claim 1 , wherein the scanning unit is formed by arranging, in an optical axis direction, the electro-optical deflecting element and another scanning device such that a scanning direction thereof differs by 90° relative to a deflection direction of the electro-optical deflecting element.

15. A laser microscope according to claim 14 , wherein said another scanning device comprises one of a galvanometer mirror and an acousto-optic deflecting device.

16. A laser microscope according to claim 1 , further comprising:

a wavelength switching unit configured to switch a wavelength of the laser light emitted from the laser light source; and

a control unit configured to adjust a voltage applied to the electro-optical deflecting element according to the wavelength switched by the wavelength switching unit.

17. A laser microscope according to claim 16 , wherein the control unit applies, to the electro-optical deflecting element, a voltage according to the following expression:

V =( n ref /n ) 3/2 ×V ref

where n ref is a required refractive index for laser light of a reference wavelength, V ref is a voltage corresponding to the required refractive index for the laser light of the reference wavelength, n is a required refractive index for laser light of a wavelength to be controlled, and V is a voltage corresponding to the required refractive index for the laser light of the wavelength to be controlled.

18. A laser microscope according to claim 1 , further comprising:

a control unit configured to control a deflection direction of the laser light from the electro-optical deflecting element,

wherein the control unit controls the electro-optical deflecting element with a voltage biased in one direction.

19. A laser microscope according to claim 1 , further comprising a light modulating unit configured to modulate the laser light.

20. A control method for a laser microscope in which laser light is scanned, on a specimen, by an electro-optical deflecting element including an electro-optical crystal in which a refractive index gradient is induced in an injection direction of electric current by injecting the electric current, the control method comprising:

changing a voltage applied to the electro-optical deflecting element according to a wavelength of laser light incident on the electro-optical deflecting element; and

deflecting the laser light in the injection direction of the electric current.

21. A control method for a laser microscope according to claim 20 , wherein a voltage according to the following expression is applied to the electro-optical deflecting element:

V =( n ref /n ) 3/2 ×V ref

where n ref is a required refractive index for laser light of a reference wavelength, V ref is a voltage corresponding to the required refractive index for the laser light of the reference wavelength, n is a required refractive index for laser light of a wavelength to be controlled, and V is a voltage corresponding to the required refractive index for the laser light of the wavelength to be controlled.