Method, a processor, and a system for identifying a substance
View Patent ↗A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles.
1. A method for identifying a substance, said method comprising:
determining a parameter of a first diffraction profile of the substance;
determining a parameter of a second diffraction profile of a known material; and
comparing the parameter of the first diffraction profile and the parameter of the second diffraction profile to determine an aquacity of the substance.
2. A method in accordance with claim 1 , wherein determining a parameter of a second diffraction profile comprises scanning water to generate the second diffraction profile.
3. A method in accordance with claim 1 , further comprising integrating intensities over a first range of the first diffraction profile to produce a first integration.
4. A method in accordance with claim 3 , further comprising integrating intensities over a second range of the first diffraction profile to produce a second integration.
5. A method in accordance with claim 4 , wherein determining a parameter of a first diffraction profile of the substance comprises calculating a ratio of the first integration to the second integration as the parameter of the first diffraction profile.
6. A method in accordance with claim 1 , wherein determining a parameter of a second diffraction profile of a known material comprises:
integrating intensities over a first range of the second diffraction profile to produce a first integration; and
integrating intensities over a second range of the second diffraction profile to produce a second integration; and
calculating a ratio of the first integration to the second integration as the parameter of the second diffraction profile.
7. A method in accordance with claim 1 , further comprising determining whether the substance is one of a solid and a liquid based on the aquacity and at least one threshold.
8. A method in accordance with claim 1 , further comprising determining a low limit for extending a line based on the aquacity.
9. A processor for identifying a substance, said processor configured to:
determine a parameter of a first diffraction profile of the substance;
determine a parameter of a second diffraction profile of a known material; and
compare the parameter of the first diffraction profile and the parameter of the second diffraction profile to determine an aquacity of the substance.
10. A processor in accordance with claim 9 , further configured to integrate intensities over a first range of the first diffraction profile to produce a first integration.
11. A processor in accordance with claim 10 , further configured to integrate intensities over a second range of the first diffraction profile to produce a second integration.
12. A processor in accordance with claim 11 , further configured to calculate a ratio of the first integration to the second integration as the parameter of the first diffraction profile.
13. A processor in accordance with claim 9 , further configured to:
integrate intensities over a first range of the second diffraction profile to produce a first integration;
integrate intensities over a second range of the second diffraction profile to produce a second integration; and
calculate a ratio of the first integration to the second integration as the parameter of the second diffraction profile.
14. A processor in accordance with claim 9 , wherein said processor identifies the substance by determining whether the substance is one of a solid and a liquid based on the aquacity and at least one threshold.
15. A processor in accordance with claim 9 , further configured to determine a low limit for extending a line based on the aquacity.
16. A system for identifying a substance, said system comprising:
an X-ray source configured to generate X-rays;
a detector configured to output a plurality of electrical signals upon detecting the X-rays; and
a processor configured to:
determine a parameter of a first diffraction profile of the substance based on the plurality of electrical signals;
determine a parameter of a second diffraction profile of a known material based on the plurality of electrical signals; and
compare the parameter of the first diffraction profile with the parameter of the second diffraction profile to determine an aquacity of the substance.
17. A system in accordance with claim 16 , wherein said processor is further configured to:
integrate intensities over a first range of the first diffraction profile to produce a first integration; and
integrate intensities over a second range of the first diffraction profile to produce a second integration.
18. A system in accordance with claim 17 , wherein said processor is further configured to calculate a ratio of the first integration to the second integration as the parameter of the first diffraction profile.
19. A system in accordance with claim 16 , wherein said processor is further configured to:
integrate intensities over a first range of the second diffraction profile to produce a first integration; and
integrate intensities over a second range of the second diffraction profile to produce a second integration; and
calculate a ratio of the first integration to the second integration as the parameter of the second diffraction profile.
20. A system in accordance with claim 16 , wherein said processor is further configured to:
compare the aquacity to a first threshold to determine if the substance is one of a liquid and a solid; and
if the substance is determined to be the solid, compare the aquacity to a second threshold to determine if the substance is one of an amorphous solid and a crystalline solid.