IP Library Granted Patent US 8,022,350
Granted Patent B2
US 8,022,350 · App. 12/012,542 · Granted Sep 20, 2011

Imaging pixel comprising a comparator to compare integrated photocurrent to a reference value and digital output circuitry

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Quick Facts
Patent No.
US 8,022,350
App. No.
12/012,542
Granted
Sep 20, 2011
Kind
B2
Abstract

An improved CMOS pixel with a combination of analog and digital readouts to provide a large pixel dynamic range without compromising low-light performance using a comparator to test the value of an accumulated charge at a series of exponentially increasing exposure times. The test is used to stop the integration of photocurrent once the accumulated analog voltage has reached a predetermined threshold. A one-bit output value of the test is read out of the pixel (digitally) at each of the exponentially increasing exposure periods. At the end of the integration period, the analog value stored on the integration capacitor is read out using conventional CMOS active pixel readout circuits.

Claims (31)

1. A pixel comprising:

a photodetector configured to receive incident radiation and generate a photocurrent in response to the incident radiation;

a capacitor selectively coupled to the photodetector to receive the photocurrent and accumulate a charge based at least partially on the photocurrent;

a comparator circuit configured to compare the charge accumulated on the capacitor with a reference level and produce an output signal indicating how the charge accumulated on the capacitor compares to the reference level;

a decoupling circuit operable, in response to the comparator circuit output signal having a first value, to decouple the capacitor from the photodetector; and

a digital output circuit coupled to the comparator circuit to receive the comparator circuit output signal and configured to provide a digital output signal of the pixel.

2. The pixel of claim 1 , wherein the first value of the comparator circuit output signal indicates that the charge accumulated on the capacitor exceeds the reference level.

3. The pixel of claim 1 , further comprising a switch that selectively couples the capacitor to the photodetector, wherein the decoupling circuit is operable to decouple the capacitor from the photodetector by opening the switch in response to the comparator circuit output signal having the first value.

4. The pixel of claim 1 , further comprising an analog output circuit coupled to the capacitor and configured to provide an analog output signal of the pixel representative of the charge accumulated on the capacitor.

5. The pixel of claim 4 , wherein the digital output circuit is configured to generate a first value of the digital output signal of the pixel responsive to the comparator circuit output signal indicating that the charge accumulated on the capacitor exceeds the reference level, and wherein the digital output circuit is configured to generate a second value of the digital output signal of the pixel responsive to the comparator circuit output signal indicating that the reference level exceeds the charge accumulated on the capacitor.

6. The pixel of claim 5 , wherein the digital output signal is a one-bit digital signal.

7. The pixel of claim 5 , wherein the digital output circuit comprises a flip-flop having an input coupled to the comparator circuit to receive the comparator circuit output signal, and an output coupled to a bus to provide the digital output signal of the pixel.

8. The pixel of claim 7 , wherein the digital output circuit and the decoupling circuit share the flip-flop.

9. The pixel of claim 7 , further comprising a switch that selectively couples the capacitor to the photodetector, wherein the decoupling circuit is operable to decouple the capacitor from the photodetector by opening the switch in response to the comparator circuit output signal having the first value.

10. The pixel of claim 9 , wherein the decoupling circuit also comprises the flip-flop, and wherein the output of the flip-flop is coupled to the switch to control whether the switch couples the capacitor to the photodetector.

11. The pixel of claim 7 , wherein the comparator circuit is a clocked comparator configured to receive an external sample signal that triggers the comparator circuit, the external sample signal triggering the comparator circuit at one or more times during a time period to compare the charge accumulated on the capacitor to the reference level, the one or more times dividing the time period into two or more intervals.

12. The pixel of claim 11 , wherein the digital output signal identifies an interval of the two or more intervals at which the charge accumulated on the capacitor exceeds the reference level.

13. The pixel of claim 11 , wherein the two or more intervals comprises a first interval and one or more additional intervals, each of the one or more additional intervals having a duration exponentially greater than a duration of an immediately preceding interval.

14. The pixel of claim 13 , wherein the digital output signal identifies an interval of the two or more intervals at which the charge accumulated on the capacitor exceeds the reference level.

15. The pixel of claim 4 , in combination with a circuit configured to receive the digital output signal and the analog output signal and to scale the analog output signal using the digital output signal.

16. The pixel of claim 1 , further comprising a pre-charge circuit, the charge accumulated on the capacitor further comprising charge provided by the pre-charge circuit.

17. An apparatus comprising:

an imaging array comprising a plurality of pixels configured to detect radiation incident thereon, the plurality of pixels comprising at least one pixel comprising:

a photodetector configured to detect radiation incident thereon, wherein the photodetector is configured to produce a photocurrent in response to the radiation incident thereon;

a digital output configured to provide a digital output signal of the at least one pixel based on the radiation detected by the photodetector;

an analog output configured to provide an analog output signal of the at least one pixel representative of an amount of radiation detected by the photodetector;

a capacitor coupled to the photodetector to receive the photocurrent, the capacitor accumulating a charge based at least partially on the photocurrent;

a comparator circuit coupled to the capacitor and configured to compare the charge accumulated on the capacitor to a reference level and produce an output signal representative of the comparison of the charge accumulated on the capacitor to the reference level,

wherein a value of the digital output signal is determined by the output signal of the comparator circuit; and

the apparatus further comprising a processing circuit coupled to the digital output and the analog output to receive the digital output signal and the analog output signal and scale the analog output signal using the digital output signal.

18. The apparatus of claim 17 , further comprising a decoupling circuit operable, in response to the comparator circuit output signal having a first value, to decouple the capacitor from the photodetector.

Assignments (5)
SECURITY INTEREST Recorded Jun 2, 2022
From: INFRARED LABORATORIES INCORPORATED
To: TRUSTEES OF "TRUST B" UNDER THE FRANK J. AND EDITH M. LOW TRUST DATED APRIL 26, 2007
Reel/Frame 060091/0186 →
NOTICE OF EXCLUSIVE LICENSE AND PURCHASE OPTION Recorded May 10, 2019
From: INFRARED LABORATORIES, INC.
To: SEMIKING LLC
Reel/Frame 049149/0252 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2011
From: NOBLEPEAK VISION CORP.
To: INFRARED NEWCO, INC.
Reel/Frame 025855/0453 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2010
From: ACKLAND, BRYAN D.
To: NOBLE DEVICE TECHNOLOGIES CORPORATION
Reel/Frame 024135/0767 →
CHANGE OF NAME Recorded Mar 25, 2010
From: NOBLE DEVICE TECHNOLOGIES CORPORATION
To: NOBLE PEAK VISION CORP.
Reel/Frame 024135/0840 →