Method of measuring landed dot, measuring apparatus for landed dot, liquid droplet ejection apparatus, method of manufacturing electro-optic apparatus, electro-optic apparatus, and electronic apparatus
View Patent ↗A landed dot measuring method in which a topology measuring apparatus having an interferometer measures topology of a landed dot which is a functional liquid droplet landed on an inspection sheet when an inspection ejection for a functional liquid droplet ejection head is performed including: inspection-ejecting in which multiple ejection nozzles of a functional liquid droplet ejection head inspection-eject one by one at a time interval while the functional liquid droplet ejection head is moved in a main scanning direction relatively with respect to the inspection sheet and; and measuring in which respective topologies of multiple landed dots are measured while the topology measuring apparatus follows the functional liquid droplet ejection head and moves in the main scanning direction at a same speed as the functional liquid droplet ejection head relatively with respect to the inspection sheet.
1. A landed dot measuring method in which a topology measuring apparatus having an interferometer measures topology of a landed dot which is a functional liquid droplet landed on an inspection sheet when an inspection ejection for a functional liquid droplet ejection head is performed including:
inspection-ejecting in which multiple ejection nozzles of a functional liquid droplet ejection head inspection-eject one by one at a given time interval while the functional liquid droplet ejection head is moved in a main scanning direction relatively with respect to the inspection sheet and, the multiple ejection nozzles being arranged to form a line in a sub scanning direction perpendicular to the main scanning direction; and
measuring in which respective topologies of multiple landed dots are measured while the topology measuring apparatus follows the functional liquid droplet ejection head and moves in the main scanning direction and in the sub scanning direction at a same speed as the functional liquid droplet ejection head relatively with respect to the inspection sheet.
2. The landed dot measuring method according to claim 1 , wherein it further includes volume measuring which measures volume of each of the landed dots based on a result of the topology measurement.
3. The landed dot measuring method according to claim 1 , wherein it further includes position measuring which measures a positional offset amount from a designed value of each of the landed dots based on the result of the topology measurement.
4. A landed dot measuring apparatus in which a topology measuring apparatus having an interferometer measures topology of a landed dot which is a functional liquid droplet landed on an inspection sheet when an inspection ejection for a functional liquid droplet ejection head is performed comprising:
a head moving device which moves a functional liquid droplet ejection head in a main scanning direction relatively with respect to the inspection sheet;
the topology measuring apparatus which measures topology of the landed dot;
a moving device for the topology measuring apparatus which moves the topology measuring apparatus in the main scanning direction and a sub scanning direction perpendicular to the main scanning direction relatively with respect to the inspection sheet; and
a controller which controls the functional liquid droplet ejection head, the head moving device, the topology measuring apparatus and the moving device for the topology measuring apparatus,
the controller causing multiple ejection nozzles of the functional liquid droplet ejection head to inspection-eject one by one at a given time interval while moving the functional liquid droplet ejection head in the main scanning direction relatively, the multiple ejection nozzles being arranged to form a line in the sub scanning direction and measuring topologies of multiple landed dots while moving the topology measuring apparatus so as to follow the functional liquid droplet ejection head by relative movements in the main scanning direction and the sub scanning direction at a same speed as the functional liquid droplet ejection head.
5. The landed dot measuring apparatus according to claim 4 , wherein the topology measuring apparatus measures volume of each of the landed dots based on a result of the topology measurement.
6. The landed dot measuring apparatus according to claim 4 , wherein the topology measuring apparatus measures a positional offset amount from a designed value of each of the landed dots based on the result of the topology measurement.
7. A liquid droplet ejection apparatus comprising:
a landed dot measuring apparatus according to claim 4 ;
a head unit having a sub carriage in which a plurality of the functional liquid droplet ejection heads is mounted; and
a plotting device which plots by ejecting functional liquid droplets from the plurality of the functional liquid droplet ejection heads while moving the head unit relatively with respect to a workpiece.
8. The liquid droplet ejection apparatus according to claim 7 , wherein the head unit comprises a functional liquid droplet ejection head introducing a functional liquid of R color, a functional liquid droplet ejection head introducing a functional liquid of G color, and a functional liquid droplet ejection head introducing a functional liquid of B color.
9. A method of manufacturing an electro-optic apparatus wherein a film portion is formed with a functional liquid droplet on a workpiece using the liquid droplet ejection apparatus according to claim 7 .
10. An electro-optic apparatus wherein a film portion is formed with a functional liquid droplet on a workpiece using the liquid droplet ejection apparatus according to claim 7 .
11. An electro-optic apparatus manufactured by the method of manufacturing the electro-optic apparatus according to claim 9 .
12. An electronic apparatus having the electro-optic apparatus according to claim 10 .