Large signal scattering functions from orthogonal phase measurements
View Patent ↗The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.
1. A method comprising:
applying a large signal, having one or more fundamental frequencies with associated amplitudes and phases, to a device under test, and
measuring a first vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test;
at each port of the device under test and each harmonic or intermodulation frequency of interest,
applying separately N small signals at N controlled, distinct phases to the device under test while continuing to apply the large signal, where N is an integer greater than or equal to 2, and
measuring a vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test for each small signal;
extracting linearized scattering functions using the N+1 sets of measurements.
2. The method of claim 1 , wherein N=2 and the phase of the second small signal is nearly orthogonal to the phase of the first small signal.
3. The method of claim 1 , wherein N>=3 and the N small signals have phases separated by approximately 360/N degrees.
4. A method comprising:
applying a first large signal, having one or more fundamental frequencies with associated amplitudes and a first set of phases, to a device under test;
measuring a first vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test;
at each port of the device under test and harmonic or intermodulation frequency of interest,
applying a small signal with a fixed phase to the device under test while continuing to apply the first large signal, and
measuring a second vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test;
shifting N−1 times, where N is an integer greater than or equal to 2, the phases of the large signal tones such that the phase shifts are equivalent to distinct time translations of the first large signal of between 0 and T, where T is the period of the small signal, and
measuring a vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test at each set of large signal phases;
extracting linearized scattering functions using the N+1 sets of measurements.
5. The method of claim 4 , wherein N=2 and the phase shifts of the second large signal are nearly equivalent to a time translation of the first large signal of T/4 or 3T/4.
6. The method of claim 4 , wherein N>=3 and the phase shifts of the last N−1 large signals are nearly equivalent to time translations of the first large signal between 0 and T separated by approximately T/N.
7. A method for testing a device under test comprising:
for an apparatus including,
a first and a second source;
a signal separation and stimulus control circuit, receiving the first and the second source, connected to the device under test;
a signal conditioning circuit receiving outputs of the signal and separation stimulus control circuit; and
a display receiving an output of the digitization and signal conditioning circuit;
applying a first large signal, having a fundamental frequency, an amplitude, and a first phase, to a device under test;
measuring a first vector of scattered and transmitted waves for all harmonics at each port of the device under test;
at each port of the device under test and each harmonic of interest, while continuing to apply the first large signal,
applying separately N small signals at N controlled, distinct phases, to the device under test, where N is an integer greater than or equal to 2, and
measuring a vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test for each small signal; and
extracting linearized scattering functions using the N+1 sets of measurements.
8. The method of claim 7 , wherein N=2 and the phase of the second small signal is nearly orthogonal to the phase of the first small signal.
9. The method of claim 7 , wherein N>=3 and the N small signals have phases separated by approximately 360/N degrees.
10. A method for testing a device under test comprising:
for an apparatus including,
a first and a second source;
a signal separation and stimulus control circuit receiving the first and the second source, connected to the device under test;
a signal conditioning circuit receiving outputs of the signal and separation stimulus control; and
a display receiving an output of the digitization and signal conditioning circuit;
applying a first large signal, having a fundamental frequency, an amplitude, and a first phase, to a device under test;
measuring a first vector of scattered and transmitted waves for all harmonics at each port of the device under test;
at each port of the device under test and each harmonic of interest,
applying a small signal with a fixed phase to the device under test while continuing to apply the first large signal, and
measuring a second vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test;
shifting N−1 times, where N is an integer greater than or equal to 2, the phases of the large signal tones such that the phase shifts are equivalent to distinct time translations of the first large signal of between 0 and T where T is the period of the small signal, and
measuring a vector of scattered and transmitted waves for all desired harmonics and intermodulation products at each port of the device under test at each set of large signal phases;
extracting linearized scattering functions using the N+1 sets of measurements.
11. The method of claim 10 , wherein N=2 and the phase shifts of the second large signal are nearly equivalent to a time translation of the first large signal of T/4 or 3T/4.
12. The method of claim 10 , wherein N>=3 and the phase shifts of the last N−1 large signals are nearly equivalent to time translations of the first large signal between 0 and T separated by approximately T/N.