Method of improving signal-to-noise for quantitation by mass spectrometry
View Patent ↗Selectivity of a measurement from a mass spectrometer is improved by selecting an extracted ion current window for the measurement after data acquisition. A plurality of mass spectra are acquired over a period of time. A first extracted ion current window is selected and from the plurality of mass spectra a first intensity as a function of time is calculated for an ion using the first extracted ion current window. A second extracted ion current window is selected and from the plurality of mass spectra a second intensity as a function of time is calculated for the ion using the second extracted ion current window. A first signal-to-noise ratio of the first intensity is compared with a second signal-to-noise ratio of the second intensity. If the second signal-to-noise ratio is greater than the first signal-to-noise ratio, the second intensity as a function of time is used for the measurement.
1. A method for improving selectivity of a measurement from a mass spectrometer, comprising:
acquiring a plurality of mass spectra of a material over a period of time;
selecting a first extracted ion current window and calculating from the plurality of mass spectra a first intensity as a function of time for an ion using the first extracted ion current window;
selecting a second extracted ion current window and calculating from the plurality of mass spectra a second intensity as a function of time for the ion using the second extracted ion current window, wherein the first extracted ion current window comprises a first center position, the second extracted ion current window comprises a second center position, and the first center position is not equal to the second center position;
comparing a first signal-to-noise ratio of the first intensity with a second signal-to-noise ratio of the second intensity; and
if the second signal-to-noise ratio is greater than the first signal-to-noise ratio, using the second intensity for the measurement.
2. The method of claim 1 ,
wherein the plurality of mass spectra comprise a product ion spectrum and the ion comprises a product ion of a multiple reaction monitoring experiment.
3. The method of claim 1 , wherein the first extracted ion current window and the second extracted ion current window are selected after the acquisition of the plurality of mass spectra.
4. The method of claim 1 , wherein the first extracted ion current window comprises a first width and the second extracted ion current window comprises a second width.
5. The method of claim 4 , wherein the first width is larger than the second width.
6. The method of claim 4 , wherein the first width comprises a value less than 0.02 atomic mass units.
7. The method of claim 4 , wherein the second width comprises a value less than 0.02 atomic mass units.
8. The method of claim 1 , wherein the measurement comprises quantitation.
9. A method for determining an extracted ion current window to use for a mass spectrometer measurement, comprising:
acquiring a plurality of mass spectra of a material over a period of time;
selecting an initial extracted ion current window;
setting the extracted ion current window equal to the initial extracted ion current window and calculating from the plurality of mass spectra an intensity as a function of time for an ion using the extracted ion current window; and
repeating steps comprising:
changing a parameter of the extracted ion current window by an increment, wherein the parameter comprises a center position,
calculating from the plurality of mass spectra a next intensity as a function of time for the ion using the parameter, and
calculating a next signal-to-noise ratio from the next intensity, until a stop condition is reached.
10. The method of claim 9 , wherein the stop condition comprises the next signal-to-noise ratio reaching a maximum signal-to-noise ratio.
11. The method of claim 9 , wherein the stop condition comprises the next signal-to-noise ratio becoming greater than or equal to a threshold.
12. The method of claim 9 , further comprising repeating the step of changing a second parameter of the extracted ion current window by a second increment, wherein the second parameter comprises a width until the stop condition is reached.
13. The method of claim 9 , wherein changing the parameter of the extracted ion current window by the increment comprises decreasing the parameter of the extracted ion current window by the increment.
14. The method of claim 9 , wherein changing the parameter of the extracted ion current window by the increment comprises increasing the parameter of the extracted ion current window by the increment.
15. The method of claim 9 , wherein the initial extract ion current window is selected after acquisition of the plurality of mass spectra.
16. The method of claim 9 , wherein the increment comprises 0.01 atomic mass units.
17. A mass spectrometry system, comprising:
a mass spectrometer; and
a computer system in communication with the mass spectrometer that:
acquires a plurality of mass spectra of a material over a period of time;
selects a first extracted ion current window and calculates from the plurality of mass spectra a first intensity as a function of time for an ion using the first extracted ion current window;
selects a second extracted ion current window and calculates from the plurality of mass spectra a second intensity as a function of time for the ion using the second extracted ion current window, wherein the first extracted ion current window comprises a first center position, the second extracted ion current window comprises a second center position, and the first center position is not equal to the second center position;
compares a first signal-to-noise ratio of the first intensity with a second signal-to-noise ratio of the second intensity; and
if the second signal-to-noise ratio is greater than the first signal-to-noise ratio, uses the second intensity for the measurement.
18. The mass spectrometry system of claim 17 , wherein the computer system selects the first extracted ion current window and the second extracted ion current window after the acquisition of the plurality of mass spectra.
19. The mass spectrometry system of claim 17 , wherein the mass spectrometer comprises a time of flight mass spectrometer.
20. The mass spectrometry system of claim 17 , wherein the spectrometer comprises an electrospray ionization time of flight mass spectrometer.
21. A computer-readable medium whose contents cause a processor to perform a method for improving selectivity of a measurement from a mass spectrometer, the contents comprising:
acquiring a plurality of mass spectra of a material over a period of time;
selecting a first extracted ion current window and calculating from the plurality of mass spectra a first intensity as a function of time for an ion using the first extracted ion current window;
selecting a second extracted ion current window and calculating from the plurality of mass spectra a second intensity as a function of time for the ion using the second extracted ion current window, wherein the first extracted ion current window comprises a first center position, the second extracted ion current window comprises a second center position, and the first center position is not equal to the second center position;
comparing a first signal-to-noise ratio of the first intensity with a second signal-to-noise ratio of the second intensity; and
if the second signal-to-noise ratio is greater than the first signal-to-noise ratio, using the second intensity for the measurement.
22. The computer-readable medium of claim 21 , wherein the first extracted ion current window and the second extracted ion current window are selected after the acquisition of the plurality of mass spectra.