Spectrally tunable infrared image sensor having multi-band stacked detectors
View Patent ↗A tunable infrared detector is provided that includes a substrate, a bottom wavelength detector formed over the substrate, a top wavelength detector formed over the first wavelength detector layer, and an interferometer filter formed over the top wavelength detector layer and the bottom wavelength detector layer. The interferometer filter is operatively configured to pass a first wavelength associated with a first portion of a predetermined band and a second wavelength associated with a second portion of the predetermined band to the top wavelength detector. The top wavelength detector is operatively configured to detect each wavelength associated with the first portion of the predetermined band and to transmit each wavelength associated with the second portion of the predetermined band to the bottom wavelength detector. The bottom wavelength detector is operatively configured to detect each wavelength associated with the second portion of the predetermined band.
1. An infrared detector, comprising:
a substrate;
a bottom wavelength detector formed over the substrate, the bottom wavelength detector having a top side;
a passivation layer formed on the top side of the bottom wavelength detector;
a top wavelength detector mounted on the passivation layer so that the top wavelength detector is formed over the bottom wavelength detector layer; and
an interferometer filter formed over the top wavelength detector layer and the bottom wavelength detector layer, said interferometer filter comprising:
a first mirror having a first plurality of dielectric layers,
a second mirror having a second plurality of dielectric layers, and
at least two flexible supports disposed between the first mirror and the second mirror such that the first mirror is substantially parallel with and disposed a first predetermined distance over the second mirror;
wherein
the interferometer filter is configured to be tuned by said flexible supports moving the first mirror from the first predetermined distance to a second predetermined distance over the second mirror in response to at least one of an electrical and mechanical input to said supports;
the interferometer filter simultaneously passes a first wavelength associated with a first portion of a predetermined band and a second wavelength associated with a second portion of the same predetermined band to the top wavelength detector,
the top wavelength detector is operatively configured to detect each wavelength associated with the first portion of the predetermined band and to transmit each wavelength associated with the second portion of the predetermined band to the bottom wavelength detector, and
the bottom wavelength detector is operatively configured to detect each wavelength associated with the second portion of the predetermined band, and
the bottom wavelength detector detects the second wavelength in the second portion of the predetermined band approximately simultaneously with the top wavelength detector detecting the first wavelength in the first portion of the same predetermined band.
2. The infrared detector according to claim 1 , wherein the interferometer filter is a Fabry Perot filter.
3. The infrared detector according to claim 1 further comprising a readout circuit operatively connected to each of the flexible supports and operatively configured to selectively provide the electrical or mechanical input to each of the flexible supports.
4. The infrared detector according to claim 3 , wherein the readout circuit is operatively connected to the top wavelength detector and the bottom wavelength detector and operatively configured to simultaneously read from each detector a respective radiation signal corresponding to the respective wavelength detected by each detector.
5. The infrared detector according to claim 3 , wherein the interferometer filter is operatively configured to pass a third wavelength associated with the first portion of the predetermined band and a fourth wavelength associated with the second portion of the predetermined band to the top wavelength detector when the first mirror is disposed at the second predetermined distance over the second mirror so that the bottom wavelength detector detects the fourth wavelength in the second portion of the predetermined band approximately simultaneously with the top wavelength detector detecting the third wavelength in the first portion of the same predetermined band.
6. The infrared detector according to claim 1 , wherein the first predetermined distance is approximately 1.4 μm and the second predetermined distance is approximately 0.8 μm.
7. The infrared detector according to claim 1 , wherein the predetermined band corresponds to the short wave infrared band.
8. The infrared detector according to claim 1 , wherein the first portion of the predetermined band is in the range of 1 μm to 1.4 μm.
9. The infrared detector according to claim 1 , wherein the second portion of the predetermined band is in the range of 1.5 μm to 2.3 μm.
10. The infrared detector according to claim 1 , wherein the top wavelength detector has a first cut-off wavelength corresponding to the first portion of the predetermined band and the bottom wavelength detector has a second cut-off wavelength corresponding to the second portion of the predetermined band.
11. The infrared detector according to claim 1 , each flexible support includes a respective membrane member upon which the first mirror is disposed, each membrane member is adapted to be biased away from the first mirror based on the electrical or mechanical input.
12. The infrared detector according to claim 1 , wherein the first mirror and the second mirror are each a chirped Bragg mirror.
13. The infrared detector according to claim 12 , wherein the dielectric layers of the first mirror and the dielectric layers of the second mirror each comprise an alternating sequence of layers of two different dielectric materials, in which the first of the two dielectric materials has a high refractive index and the second of the two dielectric materials has a low refractive index.
14. The infrared detector according to claim 13 , wherein the first of the two dielectric materials having the high refractive index is one of germanium (Ge) or amorphous Si.
15. The infrared detector according to claim 13 , wherein the second of the two dielectric materials having the low refractive index is SiOx.
16. The infrared detector according to claim 13 , wherein each of the dielectric layers of the first mirror has a respective thickness and the thickness of at least one of the dielectric layers of the first mirror is different than the thickness of each of the other dielectric layers of the first mirror.
17. The infrared detector according to claim 13 , wherein each of the dielectric layers of the first mirror has a different thickness and are arranged such that the thickness of each of the dielectric layers of the first mirror varies relative to thickness of an adjacent dielectric layer.
18. The infrared detector according to claim 17 , wherein the dielectric layers of the second mirror correspond in reverse sequential order to the dielectric layers of the first mirror such that the first dielectric layer of the first mirror corresponds in thickness and dielectric material to the last layer of the second mirror.
19. An infrared imaging system, comprising:
one or more pixels, at least one of the pixels having a tunable infrared detector, the tunable infrared detector including:
a substrate;
a bottom wavelength detector formed over the substrate, the bottom wavelength detector having a top side;
a passivation layer formed on the top side of the bottom wavelength detector;
a top wavelength detector mounted on the passivation layer so that the top wavelength detector is formed over the bottom wavelength detector layer; and
an interferometer filter formed over the top wavelength detector layer and the bottom wavelength detector layer, said interferometer filter comprising:
a first mirror having a first plurality of dielectric layers,
a second mirror having a second plurality of dielectric layers, and
at least two flexible supports disposed between the first mirror and the second mirror such that the first mirror is substantially parallel with and disposed a first predetermined distance over the second mirror;
wherein
the interferometer filter is configured to be tuned by said flexible supports moving the first mirror from the first predetermined distance to a second predetermined distance over the second mirror in response to at least one of an electrical and mechanical input to said supports;
the interferometer filter simultaneously passes a first wavelength associated with a first portion of a predetermined band and a second wavelength associated with a second portion of the same predetermined band to the top wavelength detector, the top wavelength detector is operatively configured to detect each wavelength associated with the first portion of the predetermined band and to transmit each wavelength associated with the second portion of the predetermined band to the bottom wavelength detector, and the bottom wavelength detector is operatively configured to detect each wavelength associated with the second portion of the predetermined band, and
the bottom wavelength detector detects the second wavelength in the second portion of the predetermined band approximately simultaneously with the top wavelength detector detecting the first wavelength in the first portion of the same predetermined band, and
the tunable infrared detector further comprises a readout circuit that is operatively connected to the top wavelength detector and the bottom wavelength detector and operatively configured to read from each detector a respective radiation signal corresponding to the respective wavelength detected by each detector.
20. An infrared imaging system according to claim 19 , wherein the readout circuit is operatively connected to each of the flexible supports and operatively configured to selectively provide the electrical or mechanical input to each of the flexible supports.
21. An infrared imaging system according to claim 19 , wherein the interferometer filter is operatively configured to pass the first wavelength and the second wavelength when the first mirror is disposed at the first predetermined distance over the second mirror.
22. An infrared imaging system according to claim 19 , wherein the interferometer filter is operatively configured to pass a third wavelength associated with the first portion of the predetermined band and a fourth wavelength associated with the second portion of the predetermined band to the top wavelength detector when the first mirror is disposed at the second predetermined distance over the second mirror so that the bottom wavelength detector detects the fourth wavelength in the second portion of the predetermined band approximately simultaneously with the top wavelength detector detecting the third wavelength in the first portion of the same predetermined band.
23. An infrared imaging system according to claim 19 , wherein the top wavelength detector has a first cut-off wavelength corresponding to the first portion of the predetermined band and the bottom wavelength detector has a second cut-off wavelength corresponding to the second portion of the predetermined band.
24. An infrared imaging system according to claim 19 , each flexible support includes a respective membrane member upon which the first mirror is disposed, each membrane member is adapted to be biased away from the first mirror based on the electrical or mechanical input.
25. An infrared imaging system according to claim 19 , wherein the first mirror and the second mirror are each a chirped Bragg mirror.
26. An infrared imaging system according to claim 25 , wherein the dielectric layers of the first mirror and the dielectric layers of the second mirror each comprise an alternating sequence of layers of two different dielectric materials, in which the first of the two dielectric materials has a high refractive index and the second of the two dielectric materials has a low refractive index.
27. An infrared imaging system according to claim 25 , wherein each of the dielectric layers of the first mirror has a different thickness and are arranged such that the thickness of each of the dielectric layers of the first mirror varies relative to thickness of an adjacent dielectric layer.
28. An infrared imaging system according to claim 27 , wherein the dielectric layers of the second mirror correspond in reverse sequential order to the dielectric layers of the first mirror such that the first dielectric layer of the first mirror corresponds in thickness and dielectric material to the last layer of the second mirror.