Method and apparatus for determining a response of a DUT to a desired large signal, and for determining input tones required to produce a desired output

1. A method of determining a response of a device under test (DUT) to a desired large signal, the method comprising:

applying an imperfect large signal, having one or more fundamental frequencies with associated amplitudes and phases, and having at least one unwanted spectral component, to the DUT;

measuring a first vector response to application of the imperfect large signal, the first vector response having spectral components measured at each port of the DUT;

sequentially applying small signals to each port of the DUT, while continuing to apply the imperfect large signal;

for each small signal applied, measuring an additional vector response having spectral components measured at each port of the DUT;

subtracting the first vector response from each additional vector response to produce difference vectors;

extracting, from the difference vectors, a linearization of a spectral map representing the DUT;

determining, using the linearization of the spectral map, a contribution of the at least one unwanted spectral component to the imperfect large signal; and

determining a response of the DUT to the desired large signal by subtracting the contribution of the at least one unwanted spectral component from the first vector response.

2. The method of claim 1 , wherein the at least one unwanted spectral component comprises at least one of: a harmonic frequency, an intermodulation frequency, and a reflection due to an imperfect load match at one of the ports of the DUT.

3. The method of claim 1 , wherein the spectral components measured at each port of the DUT comprise a vector of incident and scattered pseudo-waves.

4. The method of claim 1 , wherein the DUT is a nonlinear device.

5. The method of claim 1 , wherein the linearization of the spectral map is extracted in a domain of incident and scattered pseudo-waves.

6. The method of claim 1 , wherein the linearization of the spectral map is extracted in a domain of voltages and currents.

7. A method of determining a response of a device under test (DUT) to a desired large signal having one or more fundamental frequencies with associated amplitudes and phases, the method comprising:

extracting a linearization of a spectral map representing the DUT under drive of i) the desired large signal, or ii) an approximation of the desired large signal and at least one unwanted spectral component;

applying an imperfect large signal, having one or more fundamental frequencies with associated amplitudes and phases, and having at least one unwanted spectral component, to the DUT;

measuring a first vector response to application of the imperfect large signal, the first vector response having spectral components measured at each port of the DUT;

determining, using the linearization of the spectral map, a contribution of the at least one unwanted spectral component to the imperfect large signal; and

determining a response of the DUT to the desired large signal by subtracting the contribution of the at least one unwanted spectral component from the first vector response.

8. The method of claim 7 , wherein the at least one unwanted spectral component comprises at least one of: a harmonic frequency, an intermodulation frequency, and a reflection due to an imperfect load match at one of the ports of the DUT.

9. The method of claim 7 , wherein the spectral components measured at each port of the DUT comprise a vector of incident and scattered pseudo-waves.

10. The method of claim 7 , wherein the DUT is a nonlinear device.

11. The method of claim 7 , wherein the linearization of the spectral map is done in a domain of incident and scattered pseudo-waves.

12. The method of claim 7 , wherein the linearization of the spectral map is done in a domain of voltages and currents.

13. The method of claim 7 , wherein the desired large signal is one or more large signals with no energy at harmonic or intermodulation frequencies up to a predetermined order.

14. The method of claim 7 , wherein the desired large signal has no components resulting from reflections due to an imperfect load match at one of the ports of the DUT.

15. A method for determining input tones required to produce a desired output, the method comprising:

extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output and at least one unwanted spectral component; and

using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

16. The method of claim 15 , wherein the DUT is an amplifier and the desired output is a spectrally pure large signal having one or more fundamental frequencies with associated amplitudes and phases.

17. The method of claim 15 , wherein the DUT is a mixer and the desired output is an output that is spur-free within a band of interest.

18. The method of claim 15 , wherein the at least one unwanted spectral component comprises at least one of: a harmonic frequency, and an intermodulation frequency.

19. The method of claim 15 , wherein the DUT is a nonlinear device.

20. The method of claim 15 , wherein the linearization of the spectral map is done in a domain of incident and scattered pseudo-waves.