IP Library Granted Patent US 7,671,402
Granted Patent B2
US 7,671,402 · App. 12/069,052 · Granted Mar 2, 2010

Solid-state imaging devices

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,671,402
App. No.
12/069,052
Granted
Mar 2, 2010
Kind
B2
Abstract

A solid-state imaging device includes: a substrate; a photoelectric transducer that is provided within the substrate and generates light-generated charge in accordance with incident light; a floating diffusion that retains the light-generated charge generated from the photoelectric transducer; a transfer and retention unit that is provided between the photoelectric transducer and the floating diffusion for a purpose of controlling a transfer of the light-generated charge and has a charge-retaining region that can retain the light-generated charge generated from the photoelectric transducer; a reset unit that initializes a potential of the floating diffusion; an amplifying transistor that generates an output based on a potential of the floating diffusion; a selection transistor that selectively outputs an output of the amplifying transistor; and an excessive charge-discharging unit that discharges excessive electric charge generated from the photoelectric transducer.

Claims (36)

1. A solid-state imaging device, comprising:

a photoelectric transducer that is adapted to generate a light-generated charge in accordance with incident light,

a floating diffusion that is adapted to retain the light-generated charge generated from the photoelectric transducer;

a transfer and retention unit that is disposed between the photoelectric transducer and the floating diffusion and is adapted to control a transfer of the light-generated charge, the transfer and retention unit having a charge-retaining region that is adapted to retain the light-generated charge generated from the photoelectric transducer;

a reset unit that is adapted to initialize a potential of the floating diffusion;

an amplifying transistor that is adapted to generate an output based on a potential of the floating diffusion;

a selection transistor that is adapted to selectively output the output of the amplifying transistor; and

an excessive charge-discharging unit that is adapted to discharge excessive electric charge generated from the photoelectric transducer, the excessive charge-discharging unit being positioned such that the photoelectic transducer is positioned between the transfer and retention unit and the excessive charge-discharging unit.

2. The solid-state imaging device according to claim 1 ,

wherein the photoelectric transducer includes:

a first impurity region;

wherein the excessive charge-discharging unit includes:

a second impurity region that is coupled to a fixed potential point; and

a third impurity region that contacts the second impurity region and the first impurity region.

3. A solid-state imaging device comprising:

a photoelectric transducer that is adapted to generate a light-generated charge in accordance with incident light, the photoelectric transducer including a first impurity region;

a floating diffusion that is adapted to retain the light-generated charge generated from the photoelectric transducer;

a transfer and retention unit that is disposed between the photoelectric transducer and the floating diffusion and that is adapted to control a transfer of the light-generated charge, the transfer and retention unit having a charge-retaining region that is adapted to retain the light-generated charge generated from the photoelectric transducer;

a reset unit that is adapted to initialize a potential of the floating diffusion;

an amplifying transistor that is adapted to generate an output based on a potential of the floating diffusion;

a selection transistor that is adapted to selectively output the output of the amplifying transistor; and

an excessive charge-discharging unit that is adapted to discharge excessive electric charge generated from the photoelectric transducer, the excessive charge-discharging unit including: a second impurity region that is coupled to a fixed potential point; and a third impurity region that contacts the second impurity region and the first impurity region.

4. A solid-state imaging device, comprising:

a photoelectric transducer that is adapted to generate a light-generated charge in accordance with incident light;

a floating diffusion that is adapted to retain the light-generated charge generated from the photoelectric transducer;

a transfer and retention unit that is disposed between the photoelectric transducer and the floating diffusion and that is adapted to control a transfer of the light-generated charge, the transfer and retention unit having a charge-retaining region and an impurity region, the charge-retaining region being adapted to retain the light-generated charge generated from the photoelectric transducer, and the impurity region connecting the charge-retaining region and the floating diffusion;

a reset unit that is adapted to initialize a potential of the floating diffusion;

an amplifying transistor that is adapted to generate an output based on a potential of the floating diffusion;

a selection transistor that is adapted to selectively output the output of the amplifying transistor; and

an excessive charge-discharging unit that is adapted to discharge excessive electric charge generated from the photoelectric transducer.

5. The solid-state imaging device according to claim 3 ,

wherein the photoelectric transducer includes:

a second impurity region;

wherein the excessive charge-discharging unit includes:

a third impurity region that is coupled to a fixed potential point; and

a fourth impurity region that contacts the second impurity region and the third impurity region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2020
From: SEIKO EPSON CORPORATION
To: 138 EAST LCD ADVANCEMENTS LIMITED
Reel/Frame 051707/0399 →