IP Library Granted Patent US 8,453,551
Granted Patent B2
US 8,453,551 · App. 12/070,801 · Granted Jun 4, 2013

Energy focusing system for active denial apparatus

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Quick Facts
Patent No.
US 8,453,551
App. No.
12/070,801
Granted
Jun 4, 2013
Kind
B2
Abstract

An active denial apparatus for use in non-lethal weaponry includes at least one focusing element configured to focus millimeter-wave energy along an axis of propagation. The at least one focusing element includes an astigmatic or dual axis focusing system configured to direct a focused beam that allows the active denial apparatus to accurately immobilize targets at both close and long range within acceptable limits of intensity.

Claims (29)

1. An active denial apparatus comprising:

a high-power millimeter wave source; and

at least one beam-processing element for directing radiated millimeter-wave energy along an axis of propagation, the at least one beam-processing element comprising an astigmatic focusing system configured to direct a focused, near-field beam having a focusing profile in a plane defined by a x-axis and a z-axis that includes an axis of propagation, and a substantially different focusing profile in a plane defined by a y-axis and the z-axis also including the axis of propagation that is perpendicular to the x-plane.

2. The active denial apparatus of claim 1 , wherein the astigmatic focusing system is configured to direct the focused, near-field beam with an effective cross-sectional area that is substantially constant over a wide range in the direction of propagation.

3. The active denial apparatus of claim 1 , wherein the focusing profile diverges in the plane defined by the x-axis and the z-axis and converges in the plane defined by the y-axis and the z-axis.

4. The active denial apparatus of claim 1 , wherein the at least one beam processing element includes a shaped reflector.

5. The active denial apparatus of claim 1 , wherein the at least one beam processing element includes a shaped transmissive lens.

6. The active denial apparatus of claim 1 , wherein the at least one beam-processing element further comprises a main reflector and a sub-reflector, the sub-reflector configured to match a size and a divergence of millimeter waves emanating from the high-power millimeter wave source to the main reflector to achieve desired focusing profiles in the plane defined by the x-axis and the z-axis and the plane defined by the y-axis and the z-axis, the main reflector configured to provide final focusing of the focused, near-field beam.

7. The active denial apparatus of claim 1 , wherein the at least one beam-processing element includes a flat-panel array antenna.

8. The active denial apparatus of claim 1 , wherein the at least one beam-processing element includes a phased array system.

9. The active denial apparatus of claim 1 , wherein the high-power millimeter-wave source includes a solid-state source.

10. The active denial apparatus of claim 9 , wherein the high-power millimeter-wave source includes a grid amplifier.

11. The active denial apparatus of claim 9 , wherein the high-power millimeter-wave source includes a grid oscillator.

12. The active denial apparatus of claim 1 , wherein the high-power millimeter-wave source includes a vacuum tube-based source.

13. A method of focusing energy in an active denial apparatus comprising:

generating millimeter-wave energy from a high-power millimeter-wave source; and

radiating directing the millimeter-wave energy along an axis of propagation, wherein at least one beam processing element for radiating the millimeter-wave energy includes an astigmatic focusing system configured to direct a focused, near field beam with a focusing profile in a plane defined by a x-axis and a z-axis, which contains an axis of propagation, the z-axis, and a substantially different focusing profile in a plane defined by a y-axis and the z-axis, which contains the axis of propagation, the z-axis, and is perpendicular to the plane defined by the x-axis and the z-axis.

14. The method of claim 13 , further comprising matching a size and a divergence of millimeter waves emanating from the high-power millimeter-wave source to a main reflector to achieve desired beam profiles in the plane defined by the x-axis and the z-axis and the plane defined by the y-axis and the z-axis, the main reflector configured to provide final focusing of the focused beam.

15. The method of claim 13 , wherein the radiating the millimeter-wave energy along the axis of propagation further comprises configuring a sub-reflector to match the size and the divergence of millimeter waves emanating from the high-power millimeter-wave source to the main reflector.

16. The method of claim 13 , wherein the radiating the millimeter-wave energy along the axis of propagation further comprises configuring the astigmatic focusing system so that the focusing profile diverges in the plane defined by the x-axis and the z-axis and converges in the plane defined by the y-axis and the z-axis.

17. The method of claim 13 , wherein the at least one beam processing element for radiating the millimeter-wave energy includes a shaped reflector.

18. The method of claim 13 , wherein the at least one beam processing element for radiating the millimeter-wave energy includes a shaped transmissive lens.

19. The method of claim 13 , wherein the at least one beam processing element for radiating the millimeter-wave energy includes a flat-panel array antenna.

20. The method of claim 13 , wherein the at least one beam processing element for radiating the millimeter-wave energy includes a phased array system.

21. The method of claim 13 , wherein the high-power millimeter-wave source includes a solid-state source.

22. The method of claim 21 , wherein the high-power millimeter-wave source includes a grid amplifier.

23. The method of claim 21 , wherein the high-power millimeter-wave source includes a grid oscillator.

24. The method of claim 13 , wherein the high-power millimeter-wave source includes a vacuum tube-based source.

25. The method of claim 13 , further comprising alternating the millimeter-wave energy between a plurality of fixed focus settings having either different effective apertures, different effective focal lengths in the plane defined by the x-axis and the z-axis, the plane defined by the y-axis and the z-axis, or both, or both different effective apertures and effective focal lengths.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2013
From: ROSENBERG, JAMES JORDAN; DELISIO, MICHAEL PETER; DECKMAN, BLYTHE CHADWICK; ARONSON, MICHAEL LOREN
To: WAVESTREAM CORPORATION
Reel/Frame 030302/0364 →
SECURITY AGREEMENT Recorded Jul 31, 2012
From: SPACENET INC.; RAYSAT ANTENNA SYSTEMS, L.L.C.; STARBAND COMMUNICATIONS INC.; SPACENET INTEGRATED GOVERNMENT SOLUTIONS, INC.; WAVESTREAM CORPORATION
To: SILICON VALLEY BANK
Reel/Frame 028681/0929 →