Numerical band gap

1. A device comprising:

a bandgap temperature sensor configured to generate a selected number of base-emitter voltages responsive to receiving a request to generate the selected number of base-emitter voltages; and

a system controller configured to:

select the number of selected base-emitter voltages to be generated responsive to a desired resolution of a bandgap reference voltage,

receive the selected number of base-emitter voltages generated by the bandgap temperature sensor, and

generate the bandgap reference voltage according to the selected number of base-emitter voltages, the bandgap reference voltage remaining substantially constant relative to a temperature associated with the bandgap temperature sensor.

2. The device of claim 1 , wherein the system controller is further configured to determine at least one difference in the selected number of base-emitter voltages, and to generate the bandgap reference voltage from the at least one difference in the selected number of base-emitter voltages and at least one of the selected number of base-emitter voltages.

3. The device of claim 2 , wherein the system controller is further configured to add the at least one difference in the selected number of base-emitter voltages to one of the selected number of base-emitter voltages to generate the bandgap reference voltage.

4. The device of claim 3 , wherein the system controller is further configured to multiply the at least one difference in the base-emitter voltages to a constant value and to add a multiplied difference to one of the selected number of base-emitter voltages to generate the bandgap reference voltage.

5. The device of claim 4 , wherein the constant value is based at least in part on a measured characteristic of the bandgap temperature sensor.

6. The device of claim 1 wherein the bandgap temperature sensor includes a variable current source configured to provide a first current to a transistor to generate a first base emitter voltage, and to provide a second current to the transistor to generate a second base-emitter voltage.

7. The device of claim 1 , further comprising an analog-to-digital converter configured to convert the selected number of base emitter voltages into digital base-emitter voltage signals, wherein the system controller is configured to generate the bandgap voltage responsive to the digital base-emitter voltage signals.

8. A method comprising:

detecting a selected number of base-emitter voltages generated by a bandgap temperature sensor, the selected number of base-emitter voltages controllable in relation to a desired resolution or granularity of a bandgap reference voltage; and

generating the bandgap reference voltage according to the selected number of base-emitter voltages, the bandgap reference voltage remaining substantially constant relative to environmental temperature variations of the bandgap temperature sensor.

9. The method of claim 8 , further comprising:

determining a difference in the selected number of base-emitter voltages; and

generating the bandgap reference voltage from the difference in the selected number of base-emitter voltages and at least one of the selected number of base-emitter voltages.

10. The method of claim 9 , wherein the generating the bandgap reference voltage includes adding the difference in the selected number of base-emitter voltages to one of the selected number of base-emitter voltages.

11. The method of claim 10 , wherein the generating the bandgap reference voltage includes:

multiplying the difference in the selected number of base-emitter voltages with a constant value; and

adding the multiplied difference to one of the selected number of base emitter voltages.

12. The method of claim 11 , wherein the constant value is based at least in part on a measured characteristic of the bandgap temperature sensor.

13. The method of claim 8 , further comprising:

generating a first base-emitter voltage responsive to a first current being provided to a transistor;

generating a second base-emitter voltage responsive to a second current being provided to the transistor;

determining a difference between the first base-emitter voltage and the second base-emitter voltage; and

generating the bandgap reference voltage based, at least in part, on the determined difference between the first base-emitter voltage and the second base-emitter voltage.

14. A system comprising:

a memory configured to store computer-executable instructions; and

a microprocessor configured to execute the computer-executable instructions stored in the memory, the computer-executable instructions when executed by the microprocessor, cause the microprocessor to:

receive a selected number of base-emitter voltages generated by a bandgap temperature sensor, the selected number of base-emitter voltages controllable in relation to a desired resolution of a bandgap reference voltage; and

generate the bandgap reference voltage responsive to the selected number of base-emitter voltages, the bandgap reference voltage remaining substantially constant relative to environmental temperature variations of the bandgap temperature sensor.

15. The system of claim 14 , wherein the microprocessor is operable to determine a difference in the selected number of base-emitter voltages, and generate the bandgap reference voltage from the difference in the selected number of base-emitter voltages and at least one of the selected number of base-emitter voltages.

16. The system of claim 15 wherein the base-emitter voltages decrease as the environmental temperature increases, and the difference increases as the environment temperature increases.

17. The system of claim 15 , wherein the microprocessor is operable to add the difference in the selected number of base-emitter voltages to one of the selected number of base-emitter voltages to generate the bandgap reference voltage.

18. The system of claim 17 , wherein the microprocessor is operable to multiply the difference in the selected number of base-emitter voltages to a constant, and add the multiplied difference in the selected number of base-emitter voltages to one of the selected number of base-emitter voltages to generate the bandgap reference voltage.

19. The system of claim 18 , wherein the constant is determined based at least in part on a measured characteristic of the bandgap temperature sensor.

20. The system of claim 14 , further comprising:

a bandgap temperature sensor configured to generate a first base-emitter voltage when a first current is provided to a transistor and to generate a second base-emitter voltage when a second current is provided to the transistor; and

wherein the microprocessor is caused to determine a difference between the first base-emitter voltage and the second base-emitter voltage, and generate the bandgap reference voltage using the determined difference between the first base-emitter voltage and the second base-emitter voltage.