Self-triggering CMOS imaging array utilizing guard region structures as light detectors
A camera having an exposure detector is disclosed. The camera includes an array of pixel sensors, CMOS circuitry that is separate from the array of pixel sensors, a guard region, and a current detector. The guard region separates the CMOS circuitry from the array of pixel sensors. The guard region is positioned such that the guard region is exposed to light when the array of pixel sensors is exposed to light. The current detector measures the current flowing from the guard region to a power rail when the guard region is biased to a predetermined potential and generates a start trigger signal when the current exceeds a threshold value. A controller resets the pixel sensors in response to the start trigger signal.
1. A device comprising:
an array of pixel sensors;
CMOS circuitry separate from said array of pixel sensors;
a guard region separating said CMOS circuitry from said array of pixel sensors, said guard region being positioned such that said guard region is exposed to light when said array of pixel sensors is exposed to light; and
a current detector that measures the current flowing from said guard region to a power rail when said guard region is biased to a predetermined potential and generates a start trigger signal when said current exceeds a threshold value.
2. The device of claim 1 further comprising a controller that resets said pixel sensors in response to said start trigger signal.
3. The device of claim 1 wherein said guard region comprises a region within said array of pixel sensors.
4. The device of claim 1 wherein said controller causes said pixel sensors to be readout when said current changes from a value over said threshold value to a value less than said threshold value.
5. The device of claim 1 wherein each pixel sensor comprises an implant region having a first area and said guard region comprises an implant region having a second area, said second area being greater than 1000 times said first area.
6. The device of claim 1 wherein said guard region comprises an implant region of a first semiconductor type in a region of the opposite semiconductor type.
7. A method for triggering an imaging array comprising an array of pixel sensors and CMOS circuitry separate from said array of pixel sensors, said method comprising:
providing a guard region separating said CMOS circuitry from said array of pixel sensors, said guard region being positioned such that said guard region is exposed to light when said array of pixel sensors is exposed to light;
measuring the current flowing from said guard region to a power rail when said guard region is biased to a predetermined potential; and
generating a start trigger signal when said current exceeds a threshold value.
8. The method of claim 7 further comprising resetting said pixel sensors in response to said start trigger signal.
9. The method of claim 7 further comprising causing said pixel sensors to be readout when said current changes from a value over said threshold value to a value less than said threshold value.