Package structure for integrated circuit device
View Patent ↗A package structure for packaging at least one of a plurality of integrated circuit devices of a wafer is provided. The package structure includes an extension metal pad, a first conductive bump and an insulator layer. The extension metal pad electrically contacts the at least one of the plurality of integrated circuit devices. The first conductive bump is located on the extension metal pad. The insulator layer is located over the at least one of the plurality of integrated circuit devices and on a sidewall of it.
1. A package structure for packaging at least one of a plurality of integrated circuit devices of a wafer, said package structure comprising:
an extension metal pad electrically contacting said at least one of said plurality of integrated circuit devices;
a first conductive bump on said extension metal pad;
a second conductive bump on said first conductive bump; and
an insulator layer over said at least one of said plurality of integrated circuit devices and on a sidewall of said at least one of said plurality of integrated circuit devices,
wherein at least one of said first metal conductive bump and said second conductive bump comprises a plurality of metal particles and a polymer compound.
2. The package structure of claim 1 , wherein said plurality of metal particles comprise copper, nickel, silver, gold, or combinations thereof.
3. The package structure of claim 1 , wherein a size of said plurality of metal particles is from 1 to 10 micrometers.
4. The package structure of claim 1 , wherein said polymer compound comprises epoxy, a liquid crystal polymer, or combinations thereof.
5. The package structure of claim 1 , wherein a volume ratio of said plurality metal particles to said polymer compound is greater than 85:15.
6. The package structure of claim 1 , wherein a material of said insulator layer comprises epoxy, polyimide, benzocycle butane, a liquid crystal polymer, or combinations thereof.
7. The package structure of claim 1 , further comprising:
a metal pad between said at least one of said plurality of integrated circuit devices and said extension metal pad, so that said extension metal pad electrically contacts said at least one of said plurality of said integrated circuit devices;
wherein an area of said extension metal pad is bigger than an area of said metal pad.
8. The package structure of claim 7 , further comprising:
a passivation layer between said at least one of said plurality of integrated circuit devices and said extension metal pad.