Memory Cell Arrangement and Method for Reading State Information From a Memory Cell Bypassing an Error Detection Circuit

1 . An integrated circuit having a memory cell arrangement, the memory cell arrangement comprising:

at least one memory cell;

at least one error correction circuit; and

a controller configured to control a read operation to read state information from the at least one memory cell by reading a memory cell state information bypassing the at least one error correction circuit, or by reading the memory cell state information and supplying it to the at least one error correction circuit.

2 . The integrated circuit of claim 1 , further comprising at least one error detection circuit.

3 . The integrated circuit of claim 1 , wherein the at least one error correction circuit comprises a plurality of error correction circuits.

4 . The integrated circuit of claim 3 , wherein the plurality of error correction circuits are coupled with each other in series.

5 . The integrated circuit of claim 4 ,

wherein an input of a first error correction circuit of the plurality of error correction circuits is configured to receive the read memory cell state information;

wherein an input of a second error correction circuit of the plurality of error correction circuits is configured to receive information representing the read memory cell state information; and

wherein the second error correction circuit has a higher error correction capability than the first error correction circuit.

6 . The integrated circuit of claim 5 , wherein the controller is configured to control the second error correction circuit to carry out an error correction process on the information representing the read memory cell state information in case the first error correction circuit is unable to correct an error in the read memory cell state information.

7 . The integrated circuit of claim 2 , wherein the controller is configured to determine as to whether to control the read operation to read state information from the at least one memory cell by reading the memory cell state information bypassing the at least one error correction circuit, or by reading the memory cell state information and supplying it to the at least one error correction circuit depending on an error detection signal provided by the at least one error detection circuit, wherein the error detection signal indicates as to whether the read state information comprises an error or not.

8 . The integrated circuit of claim 1 , wherein the at least one memory cell comprises at least one non-volatile memory cell.

9 . The integrated circuit of claim 1 , wherein the at least one memory cell comprises a plurality of memory cells being serially source-to-drain coupled with each other.

10 . An integrated circuit having a memory cell arrangement, the memory cell arrangement comprising:

a memory cell;

an error correction circuit;

an output coupled to the memory cell and to the error correction circuit;

a first read path from the memory cell to the output bypassing the error correction circuit;

a second read path from the memory cell via the error correction circuit to the output;

a controller configured to control a read operation to read state information from the memory cell such that the read operation comprises:

a first read mode, in which the read state information is supplied to the output via the first read path; and

a second read mode, in which the read state information is supplied to the output via the second read path.

11 . The integrated circuit of claim 10 , further comprising at least one error detection circuit.

12 . The integrated circuit of claim 10 , further comprising a further error correction circuit coupled to the memory cell.

13 . The integrated circuit of claim 12 ,

wherein an input of the first error correction circuit is configured to receive the read memory cell state information;

wherein an input of the further error correction circuit is configured to receive information representing the read memory cell state information; and

wherein the further error correction circuit has a higher error correction capability than the error correction circuit.

14 . The integrated circuit of claim 13 , wherein the controller is configured to control the further error correction circuit to carry out an error correction process on the information representing the read memory cell state information in case the error correction circuit is unable to correct an error in the read memory cell state information.

15 . The integrated circuit of claim 11 , wherein the controller is configured to determine as to whether to control the read operation to read state information from the memory cell by reading the memory cell state information bypassing the error correction circuit, or by reading the memory cell state information and supplying it to the error correction circuit depending on an error detection signal provided by the error detection circuit, wherein the error detection signal indicates as to whether the read state information comprises an error or not.

16 . The integrated circuit of claim 10 , wherein the memory cell comprises a non-volatile memory cell.

17 . The integrated circuit of claim 10 , wherein the memory cell comprises one memory cell of a plurality of memory cells the plurality of memory cells being serially source-to-drain coupled with each other.

18 . An integrated circuit having a memory cell arrangement, the memory cell arrangement comprising:

a memory cell;

an error detection circuit;

an error correction circuit;

a controller configured to control a read operation to read state information from the memory cell by reading, in a first read mode, a memory cell state information bypassing the error correction circuit,

to determine, using the error detection circuit, whether the read memory cell state information fulfills a predefined criterion, and

depending on whether the read memory cell state information fulfills the predefined criterion, to remain in the first read mode, or to switch to a second read mode, in which the memory cell state information is read and supplied to the error correction circuit for error correction.

19 . The integrated circuit of claim 18 , wherein the predefined criterion comprises information about a number of programming cycles carried out on the memory cell arrangement or a part of the memory cell arrangement.

20 . The integrated circuit of claim 18 , wherein the predefined criterion comprises information about whether the error detection circuit detects an error in the read memory cell state information.

21 . The integrated circuit of claim 20 , further comprising a further error correction circuit.

22 . The integrated circuit of claim 21 , wherein the controller is further configured

to determine whether the read memory cell state information fulfills a further predefined criterion, and

depending on whether the read memory cell state information fulfills the further predefined criterion, to remain in the first read mode or the second read mode, or to switch to a third read mode, in which the memory cell state information is read and supplied to the further error correction circuit for error correction.

23 . The integrated circuit of claim 20 , wherein the further predefined criterion comprises information as to whether the error correction circuit is able to correct an error in the read memory cell state information.

24 . A method for reading state information in a memory cell arrangement of an integrated circuit, the method comprising:

controlling a read operation to read the state information from at least one memory cell of the memory cell arrangement by reading memory cell state information bypassing at least one error correction circuit, or by reading the memory cell state information and supplying it to the at least one error correction circuit.

25 . An integrated circuit having a memory cell arrangement, the memory cell arrangement comprising:

a memory cell;

a plurality of error correction circuits;

a controller configured to select an error correction circuit of the plurality of error correction circuits to be used for error correction when reading the memory cell.