Apparatus and method for measuring thickness of ink layer in pixel

1. An apparatus for measuring a thickness of an ink layer, the apparatus comprising:

a substrate;

a plurality of pixels disposed on the substrate and filled with ink due to a printing operation;

first and second electrodes corresponding to each of the pixels, the first and second electrodes disposed on opposite sides of each of the pixels; and

a capacitance measurement circuit electrically connected to the first and second electrodes to measure the capacitance of each of the pixels.

2. The apparatus of claim 1 , wherein the printing operation is performed using an inkjet technique, and the pixels correspond respectively to nozzles of the inkjet head.

3. The apparatus of claim 1 , wherein the thickness of an ink layer formed in each of the pixels is obtained by measuring the capacitance of the corresponding pixel.

4. The apparatus of claim 1 , further comprising a material layer disposed on the substrate to define the pixels.

5. A method of measuring a thickness of an ink layer using an apparatus comprising a substrate, a plurality of pixels disposed on the substrate and filled with ink due to a printing operation, first and second electrodes corresponding to each of the pixels, the first and second electrodes disposed on opposite sides of each of the pixels, and a capacitance measurement circuit electrically connected to the first and second electrodes to measure the capacitance of each of the pixels, the method comprising:

measuring an initial capacitance of each of the pixels when the pixels are not filled with ink;

filling the pixels with the ink due to the printing operation;

measuring the capacitance of each of the pixels using the capacitance measurement circuit; and

calculating the thickness of an ink layer filled in each of the pixels.

6. The method of claim 5 , wherein the printing operation is performed using an inkjet technique.

7. The method of claim 5 , wherein the calculating of the thickness of the ink layer is performed using a variation in the capacitance of the corresponding pixel, which is obtained by comparing the initial capacitance of the pixel with the capacitance of the pixel filled with the ink.

8. The method of claim 5 , wherein the capacitance of the pixel filled with the ink is measured in real-time during the printing operation.

9. A method of controlling nozzles of an inkjet head using an apparatus comprising a substrate, a plurality of pixels disposed on the substrate and filled with ink due to a printing operation, first and second electrodes corresponding to each of the pixels, the first and second electrodes disposed on opposite sides of each of the pixels, and a capacitance measurement circuit electrically connected to the first and second electrodes to measure the capacitance of each of the pixels, wherein the printing operation is performed using an inkjet technique, and the pixels correspond respectively to nozzles of the inkjet head, the method comprising:

measuring an initial capacitance of each of the pixels when the pixels are not filled with the ink;

filing the pixels corresponding to the nozzles with the ink by applying voltages having preset waveforms to the respective nozzles of the inkjet head;

measuring the capacitances of the pixels using the capacitance measurement circuit;

calculating the thickness of an ink layer filled in each of the pixels; and

setting waveforms of voltages corresponding to target thicknesses of ink layers to be formed in the nozzles of the inkjet head.

10. The method of claim 9 , wherein the calculating of the thickness of the ink layer is performed using a variation in the capacitance of the corresponding pixel, which is obtained by comparing the initial capacitance of the pixel with the capacitance of the pixel filled with the ink.

11. The method of claim 9 , after setting the waveforms of the voltages, the method further comprising repeating an operation of measuring the initial capacitance of each of the pixels through an operation of setting the waveforms of the voltages at least once.