Non-contact deviation measurement system
View Patent ↗A non-contacting deviation measurement system projects a first line and a second line upon a surface of an object. The projections of the first line and second line are arranged to overlap at an intersection line oriented at a nominal location such that when the surface is oriented at the nominal location, the intersection line appears on the surface. As the location of the surface deviates from the nominal location, the first line and second line as projected upon the surface move away from one another. The distance between the lines may be used to calculate the deviation from the nominal location. The deviation calculated may be compared to a predetermined maximum allowable deviation.
1. A deviation measuring system comprising:
a first projector arranged to project a first line and a second projector arranged to project a second line, said first line comprising a wavelength that is different from a wavelength of said second line, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
a sensor positioned to capture an image of the projections of the first line and the second line upon a surface of an object; and
analysis software to analyze the image, the analysis software capable of distinguishing the first line from the second line at multiple line orientations, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein each projector is moveable along an arcuate path; and
wherein said intersection line defines a center of each arcuate path.
2. The deviation measuring system of claim 1 , wherein said intersection line extends orthogonal to a direction of the deviation measurement.
3. The deviation measuring system of claim 1 , wherein said first line appears different from said second line.
4. The deviation measuring system of claim 1 , wherein said sensor is an optical sensor.
5. The deviation measuring system of claim 1 , comprising a mount, said first projector attached to said mount.
6. The deviation measuring system of claim 5 , wherein said first projector is slidably engaged with said mount.
7. The deviation measuring system of claim 5 , wherein said first projector is moveable between a plurality of predetermined positions on said mount.
8. The deviation measuring system of claim 7 , wherein each stop position is located an equal distance from said intersection line.
9. The deviation measuring system of claim 1 , wherein said first and second projectors are moveable with respect to one another to adjust an angle between the first projection and the second projection.
10. The deviation measuring system of claim 1 , further comprising a third projector arranged to project a third line upon the surface of said object.
11. The deviation measuring system of claim 10 , wherein the third line is oriented nonparallel to said intersection line.
12. A deviation measuring system comprising:
a first projector arranged to project a first line and a second projector arranged to project a second line, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
a sensor positioned to capture an image of the projections of the first line and the second line upon a surface of an object; and
analysis software to analyze the image, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein a length of said intersection line is greater than a distance across said surface.
13. A deviation measuring system comprising:
a first projector arranged to project a first line upon a surface of an object and a second projector arranged to project a second line upon the surface of the object, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
a sensor positioned to capture an image of the projections of the first line and the second line upon said object; and
analysis software to analyze the image, the analysis software capable of distinguishing the first line from the second line at multiple line orientations, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein a fan angle of the projection of the first line is greater than zero, and a length of said intersection line is greater than a distance across said surface.
14. The deviation measuring system of claim 13 , wherein said fan angle is between 10 degrees and 170 degrees.
15. A deviation measuring system comprising:
a first projector arranged to project a first line and a second projector arranged to project a second line, the first line overlapping the second line at an intersection line, the intersection line oriented at a nominal location;
a third projector arranged to project a third line upon the surface of said object, the third line oriented nonparallel to said intersection line;
a sensor positioned to capture an image of the projections of the first line and the second line upon a surface of an object; and
analysis software to analyze the image, the analysis software calculating the deviation between a location of the surface and the nominal location;
wherein said third line bisects said intersection line at a bisection location when said surface is positioned at said nominal location.
16. The deviation measuring system of claim 15 , wherein said third line is offset from said bisection location in a first direction when said surface is positioned above said nominal location.
17. The deviation measuring system of claim 16 , wherein said third line is offset from said bisection location in a second direction when said surface is positioned below said nominal location.