IP Library Granted Patent US 7,679,946
Granted Patent B2
US 7,679,946 · App. 12/141,492 · Granted Mar 16, 2010

Memory element array having switching elements including a gap of nanometer order

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Quick Facts
Patent No.
US 7,679,946
App. No.
12/141,492
Granted
Mar 16, 2010
Kind
B2
Abstract

Disclosed is a memory element array comprising a plurality of memory elements arranged in an array, wherein the memory elements are switching elements each including a gap of nanometer order in which a switching phenomenon of resistance is caused by applying a predetermined voltage between electrodes, and the memory element array is provided with tunnel elements respectively connected to the switching elements in series, each of the tunnel elements preventing generation of a sneak path current flowing to another switching element at a time of applying the predetermined voltage.

Claims (8)

1. A memory element array comprising a plurality of memory elements arranged in an array, wherein

the memory elements are switching elements each including a gap of nanometer order in which a switching phenomenon of resistance is caused by applying a predetermined voltage between electrodes, and

the memory element array is provided with tunnel elements respectively connected to the switching elements in series, each of the tunnel elements preventing generation of a sneak path current flowing to another switching element at a time of applying the predetermined voltage.

2. The memory element array according to claim 1 , wherein the switching elements and the tunnel elements are connected with each other through conductive protection films respectively.

3. A memory element array comprising a plurality of memory elements arranged in an array, wherein

the memory elements are switching elements each including a gap of nanometer order in which a switching phenomenon of resistance is caused by applying a predetermined voltage between electrodes,

the memory element array is provided with tunnel elements respectively connected to the switching elements in series, each of the tunnel elements preventing generation of a sneak path current flowing to another switching element at a time of applying the predetermined voltage, and

the switching elements and the tunnel elements are arranged to be aligned in a vertical direction, and to be connected with each other through conductive protection films respectively.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2025
From: FUNAI GROUP CO., LTD
To: FUNAI ELECTRIC CO., LTD.
Reel/Frame 073121/0824 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2025
From: FUNAI ELECTRIC CO., LTD. (F/K/A FE-TECH CO., LTD.)
To: FEC IP LLC
Reel/Frame 073121/0883 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2015
From: FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC.
To: FUNAI ELECTRIC CO., LTD.
Reel/Frame 035295/0038 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2008
From: FURUTA, SHIGEO; MASUDA, YUICHIRO; TAKAHASHI, TSUYOSHI; ONO, MASATOSHI
To: FUNAI ELECTRIC ADVANCED APPLIED TECHNOLOGY RESEARCH INSTITUTE INC.; FUNAI ELECTRIC CO., LTD.
Reel/Frame 021610/0883 →