MONITORING SYSTEM AND MONITORING METHOD FOR SUBSTRATE PRODUCTION APPARATUS
The substrate production apparatus monitoring system of the present invention comprises a data collection unit, a data storage unit, a control state identification unit, and a data evaluation unit. The data collection unit collects control parameter data from the substrate production apparatus including a subsidiary equipment. The control parameter data collected by the data collection unit are stored in the data storage unit. The control state identification unit identifies the control state of the substrate production apparatus based on the data in the data storage unit. The data evaluation unit evaluates the identified, individual control state as to whether it is abnormal/normal. In this way, any abnormal event in the apparatus even in the idle mode can be detected prior to the substrate processing, preventing reduction in the production yield.
1 . A monitoring system for a substrate production apparatus including a subsidiary equipment in which a predetermined reaction process takes place in a reaction chamber where a substrate is placed, comprising:
a data collection unit collecting control parameter data from the substrate production apparatus in a specific sampling cycle;
a data storage unit storing the control parameter data collected by the data collection unit;
a control state identification unit identifying control states in a substrate processing mode and in an idle mode within the substrate production apparatus including the subsidiary equipment based on the obtained control parameter data stored in the data storage unit; and
a data evaluation unit determining whether or not there is any abnormal event by evaluating the obtained control parameter data in the identified individual control state.
2 . A monitoring system according to claim 1 , further comprising an analog parameter collection unit obtaining an analog parameter including a control voltage of a controlled part provided in the subsidiary equipment and converting the obtained analog parameter data to digital data.
3 . A monitoring method for a substrate production apparatus including a subsidiary equipment in which a predetermined reaction process takes place in a reaction chamber where a substrate is placed, comprising the steps of:
collecting control parameter data from the substrate production apparatus in a specific sampling cycle;
storing the control parameter data collected in the data collection step in a data storage unit;
identifying control states in a substrate processing mode and in an idle mode within the substrate production apparatus including the subsidiary equipment based on the obtained control parameter data stored in the data storage unit; and
determining whether or not there is any abnormal event by evaluating the obtained control parameter data in the identified individual control state.