Methods and devices for compensating a signal using resonators
Compensation of a signal using resonators as well as related methods and devices are described. Some embodiments include methods and devices for performing frequency compensation on a signal.
1. A device comprising:
a primary resonating structure having a first output signal;
a reference resonating structure;
a comparison element configured to compare a characteristic of the primary resonating structure to a characteristic of the reference resonating structure and to provide an output related to the comparison between the characteristics; and
a compensation circuit adapted to adjust the first output signal from the primary resonating structure based on the output from the comparison element,
wherein the characteristic of the primary resonating structure and/or the reference resonating structure is related to frequency,
wherein the characteristic of the primary resonating structure and/or the reference resonating structure is a difference between a measured frequency and a desired frequency.
2. A device comprising:
a primary resonating structure having a first output signal;
a reference resonating structure;
a comparison element configured to compare a characteristic of the primary resonating structure to a characteristic of the reference resonating structure and to provide an output related to the comparison between the characteristics; and
a compensation circuit adapted to adjust the first output signal from the primary resonating structure based on the output from the comparison element,
wherein the characteristic of the primary resonating structure and the characteristic of the reference resonating structure is selected from the group of characteristics consisting of velocity, acceleration, displacement, angular velocity, angular acceleration, and torque.
3. A method comprising:
comparing a characteristic of a primary resonating structure to a characteristic of a reference resonating structure;
providing an output related to the comparison between the characteristic of the primary resonating structure and the characteristic of the reference resonating structure; and
adjusting a first output signal from the primary resonating structure based on the output related to the comparison between the characteristics,
wherein comparing comprises determining a first difference between the characteristic of the primary resonating structure and a desired value of the characteristic.
4. The method of claim 3 , further comprising measuring the characteristic of the primary resonating structure and the characteristic of the reference resonating structure.
5. The method of claim 3 , wherein comparing comprises determining a second difference between the characteristic of the reference resonating structure and a desired value of the characteristic.
6. The method of claim 3 , wherein providing the output comprises correlating the characteristic of the primary resonating structure and the characteristic of the reference resonating structure with biasing parameters.
7. The method of claim 6 wherein the output related to the comparison between the characteristics comprises information related to the biasing parameters.
8. The method of claim 7 , wherein the adjusting comprises modifying at least one biasing parameter of the primary resonating structure based on the information related to the biasing parameters.
9. The method of claim 3 , further comprising monitoring the characteristic of the primary resonating structure and the characteristic of the reference resonating structure.
10. The method of claim 9 wherein the monitoring is accomplished using sensors and/or detectors.
11. The method of claim 3 , wherein the primary resonating structure is a mechanical resonator comprising a major element and minor elements coupled to the major element.
12. The method of claim 3 , wherein the characteristic of the primary resonating structure and/or the reference resonating structure is related to frequency.
13. The method of claim 3 , wherein adjusting the first output signal from the primary resonating structure comprises adjusting a frequency of the primary resonating structure.
14. The method of claim 3 , wherein comparing is accomplished using a comparison element comprising a look-up table.
15. A device comprising:
a resonating structure having a primary mode and a reference mode;
a comparison element configured to compare a characteristic of the primary mode to a characteristic of the reference mode and to provide an output related to the comparison between the characteristics; and
a compensation circuit adapted to adjust an output signal from the resonating structure based on the output from the comparison element,
wherein the primary mode has a first strain distribution and the reference mode has a second strain distribution.
16. The device of claim 15 , wherein the resonating structure is a mechanical resonator comprising major elements and minor elements.
17. The device of claim 15 , wherein the reference mode produces a second output signal.
18. A device comprising:
a resonating structure having a primary mode and a reference mode;
a comparison element configured to compare a characteristic of the primary mode to a characteristic of the reference mode and to provide an output related to the comparison between the characteristics; and
a compensation circuit adapted to adjust an output signal from the resonating structure based on the output from the comparison element,
wherein the resonating structure has at least one mode in addition to the primary mode and the reference mode.