Solid-state imaging device and manufacturing method thereof
View Patent ↗A solid-state imaging device includes a photoelectric conversion unit, a transistor, and an element separation region separating the photoelectric conversion unit and the transistor. The photoelectric conversion unit and the transistor constitute a pixel. The element separation region is formed of a semiconductor region of a conductivity type opposite to that of a source region and a drain region of the transistor. A part of a gate electrode of the transistor protrudes toward the element separation region side beyond an active region of the transistor. An insulating film having a thickness substantially the same as that of a gate insulating film of the gate electrode of the transistor is formed on the element separation region continuing from a part thereof under the gate electrode of the transistor to a part thereof continuing from the part under the gate electrode of the transistor.
1. A solid-state imaging device comprising:
a transistor region having a channel region of a first conductivity between source and drain regions of a second conductivity, said channel region being within a well region of a substrate;
a element separation region having first and second semiconductor regions of the first conductivity, said first and second semiconductor regions being within said well region;
a photodiode within said well region, said second semiconductor region being between said first semiconductor region and said photodiode;
a gate insulating film between said well region and a gate electrode, said gate insulating film being in physical contact with said channel region and said first semiconductor region,
wherein a protrusion of the gate electrode extends in a channel width direction from a first portion of the gate insulating film almost to said second semiconductor region, a portion of the gate insulating film being between said first semiconductor region and said protrusion.
2. The solid-state imaging device according to claim 1 , wherein a channel length of the channel region is between said source and drain regions, said channel width direction being perpendicular to said channel length.
3. The solid-state imaging device according to claim 1 , wherein the conductivity type of the first conductivity is opposite to the conductivity type of the second conductivity.
4. The solid-state imaging device according to claim 1 , wherein said well region is of the first conductivity.
5. The solid-state imaging device according to claim 1 , wherein said source and drain regions are within said well region.
6. The solid-state imaging device according to claim 1 , wherein said element separation region surrounds said transistor region, said transistor region being between a portion of said element separation region and said another portion of said element separation region.
7. The solid-state imaging device according to claim 1 , wherein said channel region, said source region, and said drain region are in physical contact with said first semiconductor region.
8. The solid-state imaging device according to claim 1 , wherein said first semiconductor region is between said second semiconductor region and said channel region.
9. The solid-state imaging device according to claim 1 , wherein said photodiode includes an accumulation layer of the first conductivity and a charge accumulation region of the second conductivity, said accumulation layer being between said charge accumulation region and said gate insulating film.
10. The solid-state imaging device according to claim 9 , wherein a portion of said accumulation layer extends into said second semiconductor region.
11. The solid-state imaging device according to claim 1 , wherein said gate insulating film between said first semiconductor region and said protrusion is of a substantially same thickness as said gate insulating film between said channel region and said another portion.
12. The solid-state imaging device according to claim 1 , wherein said second semiconductor region has an impurity density.
13. The solid-state imaging device according to claim 12 , wherein said impurity density is the same as an impurity density of said first semiconductor region.
14. The solid-state imaging device according to claim 12 , wherein said impurity density is greater than an impurity density of said first semiconductor region.
15. The solid-state imaging device according to claim 12 , wherein said impurity density is the same as an impurity density of said well region.