Microscope equipped with automatic focusing mechanism and adjustment method thereof
View Patent ↗Provided is a microscope equipped with an automatic focusing mechanism, comprising an illumination light source; an objective lens for focusing first light emitted from the illumination light source onto an object to be detected; an illumination light source for imaging the first light that is reflected by the object to be detected and passes through the objective lens; and a focal-point detector for detecting a positional shift of a microtiter plate from a focal position of the objective lens, wherein the focal-point detector includes a focal-point-detection light source for emitting focal-point-detection light serving as second light, a focal-point detection light acquisition unit on which the focal-point-detection light is focused, and a region setting unit which can set an in-focus assessable region of the focal-point-detection light acquired by the focal-point detection light acquisition unit to any position on the focal-point detection light acquisition unit.
1. A microscope equipped with an automatic focusing mechanism, comprising:
an observation light source;
an objective lens for focusing first light emitted from the observation light source on an object to be detected;
an observation optical system for imaging the first light which is reflected by the object to be detected and passes through the objective lens; and
a focal-point detector for detecting a positional shift of the object to be detected from a focal position of the objective lens,
wherein the focal-point detector includes a focal-point detection light source for emitting focal-point detection light serving as second light, an area sensor on which is focused the focal-point detection light that is emitted from the focal-point detection light source, that is focused on the object to be detected via the objective lens, and that returns via the objective lens upon reflection at the object to be detected, and a region setting unit which can set an in-focus assessable region of the focal-point detection light acquired by the area sensor to any position on the area sensor,
wherein the region setting unit includes a memory that stores photoreceptor data on the area sensor surface, and
wherein the region setting unit performs analysis computations on the photoreceptor data in the memory so as to assess an in-focus state of the focal-point detection light.
2. A adjustment method for a microscope equipped with an automatic focusing mechanism according to claim 1 , comprising:
positioning the object to be detected at the focal position of the objective lens; then dividing the data region of the area sensor into at least two parts centered on the focal-point detection light focused on the area sensor; assessing an in-focus state of the objective lens on the basis of a brightness value of the focal-point detection light in each divided data region during a subsequent automatic focal-point detection operation; and moving the objective lens to an in-focus position on the basis of the assessment result.