Nonvolatile memory device, nonvolatile memory system, and defect management method for nonvolatile memory device
View Patent ↗A life parameter generator generates life parameters related to the life of a nonvolatile memory device by using parameters related to allowable capacity for memory defect and occurrence capacity for memory defect. The life parameters are stored in a life parameter storing block of a nonvolatile memory. An access device reads and displays the stored life parameters. Thus, the user can precisely know the life of the nonvolatile memory device or the moment when a device having a built in nonvolatile memory such as a portable audio becomes unusable.
1. A nonvolatile memory device which reads and writes data in accordance with commands for an access from outside, comprising:
a nonvolatile memory;
a life parameter generator for calculating an occurrence speed for memory defect of said nonvolatile memory device and estimating an estimated remaining time for a life of said nonvolatile memory device based on an allowable capacity for memory defect of said nonvolatile memory device and said occurrence speed for memory defect; and
a life parameter output part for outputting said life parameter to the outside.
2. A nonvolatile memory system including an access device and a nonvolatile memory device which reads and writes data in accordance with commands for an access from said access device,
wherein said nonvolatile memory device comprises:
a nonvolatile memory;
a life parameter generator for calculating an occurrence speed for memory defect of said nonvolatile memory device and estimating an estimated remaining time for a life of said nonvolatile memory device based on an allowable capacity for memory defect of said nonvolatile memory device and said occurrence speed for memory defect; and
a life parameter output part for outputting said life parameter to the outside, and
wherein said access device comprises:
a life parameter receiver for receiving parameters from said life nonvolatile memory device; and
a display part for displaying the life parameter received by said life parameter receiver.
3. A defect management method for a nonvolatile memory device having a nonvolatile memory comprising steps of:
calculating an occurrence speed for memory defect of said nonvolatile memory device;
estimating an estimated remaining time for a life of said nonvolatile memory device based on an allowable capacity for memory defect of said nonvolatile memory device and said occurrence speed for memory defect; and
further indicating said estimated remaining time.